Hulsebos; Edo Maria

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hulsebos; Edo Maria.The latest application filed is for "measurement apparatus and a method for determining a substrate grid".

Company Profile

14.16.17

Hulsebos; Edo Maria - Waalre NL
Hulsebos; Edo Maria - Bergeijk NL
HULSEBOS; Edo Maria - Waaire NL
Hulsebos; Edo Maria - Waarle NL
Hulsebos; Edo Maria - 's-Hertogenbosch NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for determining deformation Grant 11,181,836 - Hulsebos , et al. November 23, 2	2021-11-23
Measurement Apparatus And A Method For Determining A Substrate Grid App 20210341846 - BIJNEN; Franciscus Godefridus Casper ; et al.	2021-11-04
Determining A Correction To A Process App 20210333785 - ROY; Sarathi ; et al.	2021-10-28
Determining a correction to a process Grant 11,086,305 - Roy , et al. August 10, 2	2021-08-10
Measurement apparatus and a method for determining a substrate grid Grant 11,079,684 - Bijnen , et al. August 3, 2	2021-08-03
Lithographic method Grant 11,029,610 - Tinnemans , et al. June 8, 2	2021-06-08
Determining A Correction To A Process App 20210165399 - ROY; Sarathi ; et al.	2021-06-03
Method For Determining Deformation App 20210149316 - HULSEBOS; Edo Maria ; et al.	2021-05-20
Lithographic method Grant 10,962,887 - Tinnemans , et al. March 30, 2	2021-03-30
Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatus Grant 10,901,326 - Hulsebos , et al. January 26, 2	2021-01-26
Lithographic Method App 20200272061 - TINNEMANS; Patricius Aloysius Jacobus ; et al.	2020-08-27
Method Of Controlling A Lithographic Apparatus And Device Manufacturing Method, Control System For A Lithographic Apparatus And App 20200201194 - Hulsebos; Edo Maria ; et al.	2020-06-25
Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatus Grant 10,620,549 - Hulsebos , et al.	2020-04-14
Lithographic Method App 20200081356 - TINNEMANS; Patricius Aloysius Jacobus ; et al.	2020-03-12
Lithographic method Grant 10,527,958 - Tinnemans , et al. J	2020-01-07
Method and apparatus for processing a substrate in a lithographic apparatus Grant 10,527,957 - Sanchez-Fabres Cobaleda , et al. J	2020-01-07
Alignment method Grant 10,514,620 - Bijnen , et al. Dec	2019-12-24
Lithographic apparatus and device manufacturing method Grant 10,474,045 - Bijnen , et al. Nov	2019-11-12
Method Of Controlling A Lithographic Apparatus And Device Manufacturing Method, Control System For A Lithographic Apparatus And App 20190265598 - HULSEBOS; Edo Maria ; et al.	2019-08-29
Measurement Apparatus And A Method For Determining A Substrate Grid App 20190235391 - BIJNEN; Franciscus Godefridus Casper ; et al.	2019-08-01
Alignment Method App 20190227446 - BIJNEN; Franciscus Godefridus Casper ; et al.	2019-07-25
Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatus Grant 10,331,040 - Hulsebos , et al.	2019-06-25
Lithographic Method App 20190094721 - TINNEMANS; Patricius Aloysius Jacobus ; et al.	2019-03-28
Method And Apparatus For Processing A Substrate In A Lithographic Apparatus App 20180356742 - SANCHEZ-FABRES COBALEDA; Cayetano ; et al.	2018-12-13
Lithographic apparatus and device manufacturing method Grant 10,139,740 - Bijnen , et al. Nov	2018-11-27
Method Of Controlling A Lithographic Apparatus And Device Manufacturing Method, Control System For A Lithographic Apparatus And Lithographic Apparatus App 20180284621 - HULSEBOS; Edo Maria ; et al.	2018-10-04
Lithographic Apparatus And Device Manufacturing Method App 20180196363 - BIJNEN; Franciscus Godefridus Casper ; et al.	2018-07-12
Lithographic apparatus and device manufacturing method Grant 9,665,012 - Hulsebos May 30, 2	2017-05-30
Lithographic Apparatus And Device Manufacturing Method App 20150241791 - Hulsebos; Edo Maria	2015-08-27
Alignment system and alignment marks for use therewith Grant 8,208,140 - Hulsebos , et al. June 26, 2	2012-06-26
Alignment system and alignment marks for use therewith Grant 8,208,139 - Hulsebos , et al. June 26, 2	2012-06-26
Alignment System and Alignment Marks for Use Therewith App 20100214550 - HULSEBOS; Edo Maria ; et al.	2010-08-26
Alignment System and Alignment Marks for Use Therewith App 20090176167 - HULSEBOS; Edo Maria ; et al.	2009-07-09

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.