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Patent applications and USPTO patent grants for Huet; Patrick Y..The latest application filed is for "process excursion detection".
Patent | Date |
---|---|
Process excursion detection Grant 8,289,510 - Huet , et al. October 16, 2 | 2012-10-16 |
Multi-scale classification of defects Grant 8,165,837 - Paramasivam , et al. April 24, 2 | 2012-04-24 |
Process Excursion Detection App 20110137576 - Huet; Patrick Y. ;   et al. | 2011-06-09 |
Process Excursion Detection App 20100067781 - Huet; Patrick Y. ;   et al. | 2010-03-18 |
Process excursion detection Grant 7,646,476 - Huet , et al. January 12, 2 | 2010-01-12 |
Process Excursion Detection App 20080204739 - Huet; Patrick Y. ;   et al. | 2008-08-28 |
Process excursion detection Grant 7,394,534 - Huet , et al. July 1, 2 | 2008-07-01 |
Detection of spatially repeating signatures Grant 7,006,886 - Huet , et al. February 28, 2 | 2006-02-28 |
Spatial signature analysis Grant 6,718,526 - Eldredge , et al. April 6, 2 | 2004-04-06 |
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