| Patent | Date |
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Methods for growing a single crystal silicon ingot using continuous Czochralski method
Grant 11,408,090 - Hudson , et al. August 9, 2 | 2022-08-09 |
Systems And Methods For Production Of Silicon Using A Horizontal Magnetic Field
App 20220228291 - Ryu; JaeWoo ; et al. | 2022-07-21 |
Ingot Puller Apparatus Having Heat Shields With Voids Therein
App 20220170176 - Ke; Jiaying ; et al. | 2022-06-02 |
High Resistivity Single Crystal Silicon Ingot And Wafer Having Improved Mechanical Strength
App 20220056616 - Basak; Soubir ; et al. | 2022-02-24 |
Methods For Producing A Monocrystalline Ingot By Horizontal Magnetic Field Czochralski
App 20220025541 - Ryu; JaeWoo ; et al. | 2022-01-27 |
High Resistivity Single Crystal Silicon Ingot And Wafer Having Improved Mechanical Strength
App 20210404088 - Basak; Soubir ; et al. | 2021-12-30 |
Single Crystal Silicon Ingot Having Axial Uniformity
App 20210363657 - Hudson; Carissima Marie ; et al. | 2021-11-25 |
Methods For Growing A Nitrogen Doped Single Crystal Silicon Ingot Using Continuous Czochralski Method
App 20210363658 - Hudson; Carissima Marie ; et al. | 2021-11-25 |
High resistivity single crystal silicon ingot and wafer having improved mechanical strength
Grant 11,142,844 - Basak , et al. October 12, 2 | 2021-10-12 |
Methods for growing a nitrogen doped single crystal silicon ingot using continuous Czochralski method
Grant 11,111,597 - Hudson , et al. September 7, 2 | 2021-09-07 |
Single crystal silicon ingot having axial uniformity
Grant 11,111,596 - Hudson , et al. September 7, 2 | 2021-09-07 |
Growth of plural sample rods to determine impurity build-up during production of single crystal silicon ingots
Grant 11,047,066 - Hudson , et al. June 29, 2 | 2021-06-29 |
Systems And Methods For Production Of Silicon Using A Horizontal Magnetic Field
App 20210180206 - Ryu; JaeWoo ; et al. | 2021-06-17 |
Methods for modeling the impurity concentration of a single crystal silicon ingot
Grant 10,954,606 - Hudson , et al. March 23, 2 | 2021-03-23 |
Methods For Growing A Nitrogen Doped Single Crystal Silicon Ingot Using Continuous Czochralski Method
App 20210079554 - Hudson; Carissima Marie ; et al. | 2021-03-18 |
Single Crystal Silicon Ingot Having Axial Uniformity
App 20210079553 - Hudson; Carissima Marie ; et al. | 2021-03-18 |
Methods For Growing A Single Crystal Silicon Ingot Using Continuous Czochralski Method
App 20200332439 - Hudson; Carissima Marie ; et al. | 2020-10-22 |
Sample rod growth and resistivity measurement during single crystal silicon ingot production
Grant 10,793,969 - Hudson , et al. October 6, 2 | 2020-10-06 |
Methods for determining the resistivity of a polycrystalline silicon melt
Grant 10,781,532 - Hudson , et al. Sept | 2020-09-22 |
High Resistivity Single Crystal Silicon Ingot And Wafer Having Improved Mechanical Strength
App 20200216975 - Basak; Soubir ; et al. | 2020-07-09 |
Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield
Grant 10,707,093 - Lee , et al. | 2020-07-07 |
Resistivity Stabilization Measurement Of Fat Neck Slabs For High Resistivity And Ultra-high Resistivity Single Crystal Silicon I
App 20200208294 - Hudson; Carissima Marie ; et al. | 2020-07-02 |
Sample Rod Center Slab Resistivity Measurement During Single Crystal Silicon Ingot Production
App 20200199775 - Lee; HyungMin ; et al. | 2020-06-25 |
Sample Rod Center Slab Resistivity Measurement With Four-Point Probe During Single Crystal Silicon Ingot Production
App 20200199774 - Lee; HyungMin ; et al. | 2020-06-25 |
Center Slab Lapping and Resistivity Measurement During Single Crystal Silicon Ingot Production
App 20200199773 - Lee; HyungMin ; et al. | 2020-06-25 |
Sample Rod Growth And Resistivity Measurement During Single Crystal Silicon Ingot Production
App 20200002836 - Hudson; Carissima Marie ; et al. | 2020-01-02 |
Methods For Modeling The Impurity Concentration Of A Single Crystal Silicon Ingot
App 20200002837 - Hudson; Carissima Marie ; et al. | 2020-01-02 |
Growth Of Plural Sample Rods To Determine Impurity Build-up During Production Of Single Crystal Silicon Ingots
App 20200002843 - Hudson; Carissima Marie ; et al. | 2020-01-02 |
Methods For Determining The Resistivity Of A Polycrystalline Silicon Melt
App 20200002835 - Hudson; Carissima Marie ; et al. | 2020-01-02 |
Methods for producing low oxygen silicon ingots
Grant 10,513,796 - Basak , et al. Dec | 2019-12-24 |
Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield
Grant 10,453,703 - Lee , et al. Oc | 2019-10-22 |
Method Of Treating Silicon Wafers To Have Intrinsic Gettering And Gate Oxide Integrity Yield
App 20190267251 - Lee; Young Jung ; et al. | 2019-08-29 |
Crystal Pulling Method Including Crucible And Conditioning Members
App 20190153615 - Zepeda; Salvador ; et al. | 2019-05-23 |
System for forming an ingot including crucible and conditioning members
Grant 10,221,500 - Zepeda , et al. | 2019-03-05 |
Methods For Producing Single Crystal Ingots Doped With Volatile Dopants
App 20180291524 - Basak; Soubir ; et al. | 2018-10-11 |
Methods For Producing Low Oxygen Silicon Ingots
App 20180237938 - Basak; Soubir ; et al. | 2018-08-23 |
Crystal Pulling System And Method Including Crucible And Conditioning Members
App 20180187329 - Zepeda; Salvador ; et al. | 2018-07-05 |
Method Of Treating Silicon Wafers To Have Intrinsic Gettering And Gate Oxide Integrity Yield
App 20180182641 - Lee; Young Jung ; et al. | 2018-06-28 |
Methods for producing low oxygen silicon ingots
Grant 9,951,440 - Basak , et al. April 24, 2 | 2018-04-24 |
Methods For Producing Low Oxygen Silicon Ingots
App 20160108551 - Basak; Soubir ; et al. | 2016-04-21 |
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