Huang; Yen-Kai
Patent Applications and Registrations
Patent applications and USPTO patent grants for Huang; Yen-Kai.The latest application filed is for "efficient solution for removing euv native defects".
- Huang; Yen-Kai - Hsinchu TW
- Huang; Yen-Kai - Hsinchu City TW
| Patent | Date |
|---|---|
| Method for repairing a mask Grant 9,952,503 - Huang , et al. April 24, 2 | 2018-04-24 |
| Efficient solution for removing EUV native defects Grant 9,759,998 - Huang , et al. September 12, 2 | 2017-09-12 |
| Durable metal film deposition for mask repair Grant 9,625,808 - Huang , et al. April 18, 2 | 2017-04-18 |
| Efficient Solution For Removing Euv Native Defects App 20160282713 - Huang; Yen-Kai ; et al. | 2016-09-29 |
| Durable Metal Film Deposition For Mask Repair App 20160238928 - Huang; Yen-Kai ; et al. | 2016-08-18 |
| Efficient solution for removing EUV native defects Grant 9,395,632 - Huang , et al. July 19, 2 | 2016-07-19 |
| Method For Repairing A Mask App 20160202605 - Huang; Yen-Kai ; et al. | 2016-07-14 |
| Method for repairing a mask Grant 9,291,890 - Huang , et al. March 22, 2 | 2016-03-22 |
| Efficient Solution For Removing Euv Native Defects App 20150378251 - Huang; Yen-Kai ; et al. | 2015-12-31 |
| Method for Repairing a Mask App 20150104732 - Huang; Yen-Kai ; et al. | 2015-04-16 |
| Apparatus of analyzing a sample and a method for the same Grant 8,819,859 - Huang , et al. August 26, 2 | 2014-08-26 |
| Apparatus of Analyzing a Sample and a Method for the Same App 20140223616 - Huang; Yen-Kai ; et al. | 2014-08-07 |
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