Huang; Junqing (Jenny)
Patent Applications and Registrations
Patent applications and USPTO patent grants for Huang; Junqing (Jenny).The latest application filed is for "systems and methods for detecting defects on a wafer".
- Huang; Junqing (Jenny) - Jenny
- Huang; Junqing (Jenny) - Fremont CA US
| Patent | Date |
|---|---|
| Systems and methods for detecting defects on a wafer Grant 10,605,744 - Chen , et al. | 2020-03-31 |
| Systems And Methods For Detecting Defects On A Wafer App 20180202943 - Chen; Lu ; et al. | 2018-07-19 |
| Systems and methods for detecting defects on a wafer Grant 9,880,107 - Chen , et al. January 30, 2 | 2018-01-30 |
| Systems and Methods for Detecting Defects on a Wafer App 20130250287 - Chen; Lu ; et al. | 2013-09-26 |
| Systems and methods for detecting defects on a wafer Grant 8,467,047 - Chen , et al. June 18, 2 | 2013-06-18 |
| Systems and Methods for Detecting Defects on a Wafer App 20120268735 - Chen; Lu ; et al. | 2012-10-25 |
| Systems and methods for detecting defects on a wafer Grant 8,223,327 - Chen , et al. July 17, 2 | 2012-07-17 |
| Systems And Methods For Detecting Defects On A Wafer App 20100188657 - Chen; Lu ; et al. | 2010-07-29 |
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