Huang; Jacky

Patent Applications and Registrations

Patent applications and USPTO patent grants for Huang; Jacky.The latest application filed is for "system for improving critical dimension uniformity".

Company Profile

0.6.8

Huang; Jacky - Chu-Bei TW
Huang; Jacky - Hsin-Chu TW
Huang; Jacky - Chu-Bei City TW
Huang; Jacky - Zhubei City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System for improving critical dimension uniformity Grant 8,027,529 - Yu , et al. September 27, 2	2011-09-27
Extracting ordinary and extraordinary optical characteristics for critical dimension measurement of anisotropic materials Grant 7,787,685 - Huang , et al. August 31, 2	2010-08-31
Method and system for optimizing sub-nanometer critical dimension using pitch offset Grant 7,777,884 - Ke , et al. August 17, 2	2010-08-17
System For Improving Critical Dimension Uniformity App 20100201961 - Yu; Shinn-Sheng ; et al.	2010-08-12
Method and system for improving critical dimension uniformity Grant 7,732,109 - Yu , et al. June 8, 2	2010-06-08
Method and system for improving accuracy of critical dimension metrology Grant 7,580,129 - Yu , et al. August 25, 2	2009-08-25
Method And System For Improving Critical Dimension Uniformity App 20080248403 - Yu; Shinn-Sheng ; et al.	2008-10-09
Method and System for Optimizing Lithography Focus and/or Energy Using a Specially-Designed Optical Critical Dimension Pattern App 20080233487 - Huang; Jacky ; et al.	2008-09-25
Method and System for Improving Accuracy of Critical Dimension Metrology App 20080204730 - Yu; Shinn-Sheng ; et al.	2008-08-28
Method and System For Optimizing Sub-Nanometer Critical Dimension Using Pitch Offset App 20080174778 - Ke; Chih-Ming ; et al.	2008-07-24
Systems and methods for optical measurement Grant 7,349,086 - Liou , et al. March 25, 2	2008-03-25
Extracting Ordinary And Extraordinary Optical Characteristics For Critical Dimension Measurement Of Anisotropic Materials App 20070242263 - Huang; Jacky ; et al.	2007-10-18
Systems and methods for optical measurement App 20070153272 - Liou; Joung-Wei ; et al.	2007-07-05
Integrated optical metrology and lithographic process track for dynamic critical dimension control App 20060222975 - Ke; Chih-Ming ; et al.	2006-10-05

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