| Patent | Date |
|---|
Semiconductor Device With Fuse And Anti-fuse Structures
App 20220285270 - HUANG; CHIN-LING | 2022-09-08 |
Semiconductor device with programmable feature and method for fabricating the same
Grant 11,424,346 - Huang August 23, 2 | 2022-08-23 |
Semiconductor structure having vertical fin with oxidized sidewall and method of manufacturing the same
Grant 11,417,737 - Huang August 16, 2 | 2022-08-16 |
Semiconductor Device With Air Gaps Between Adjacent Conductive Lines
App 20220165662 - HUANG; CHIN-LING | 2022-05-26 |
Semiconductor Device With Fuse And Anti-fuse Structures And Method For Forming The Same
App 20220157717 - HUANG; Chin-Ling | 2022-05-19 |
Method For Fabricating Semiconductor Device With Programmable Feature
App 20220093769 - HUANG; CHIN-LING | 2022-03-24 |
Method Of Manufacturing Semiconductor Structure Having Vertical Fin With Oxidized Sidewall
App 20220085178 - HUANG; CHIN-LING | 2022-03-17 |
Antifuse Structure
App 20220059456 - HUANG; Chin-Ling ; et al. | 2022-02-24 |
Antifuse structure
Grant 11,257,756 - Huang , et al. February 22, 2 | 2022-02-22 |
Method For Preparing A Memory Device
App 20220045073 - HUANG; Chin-Ling ; et al. | 2022-02-10 |
Programmable Memory Device
App 20220044747 - HUANG; CHIN-LING | 2022-02-10 |
Method for preparing a memory device
Grant 11,244,950 - Huang , et al. February 8, 2 | 2022-02-08 |
Semiconductor Structure Having Vertical Fin With Oxidized Sidewall And Method Of Manufacturing The Same
App 20220028987 - HUANG; Chin-Ling | 2022-01-27 |
Method For Fabricating Semiconductor Device With Programmable Anti-fuse Feature
App 20220020687 - HUANG; Chin-Ling | 2022-01-20 |
Semiconductor Device With Programmable Feature And Method For Fabricating The Same
App 20210408264 - HUANG; CHIN-LING | 2021-12-30 |
Semiconductor Structure And Method Of Forming The Same
App 20210384202 - KANG; Ting-Cih ; et al. | 2021-12-09 |
Semiconductor device with programmable anti-fuse feature and method for fabricating the same
Grant 11,189,565 - Huang November 30, 2 | 2021-11-30 |
Programmable memory device
Grant 11,189,357 - Huang November 30, 2 | 2021-11-30 |
Semiconductor device with fuse-detecting structure
Grant 11,121,083 - Huang September 14, 2 | 2021-09-14 |
Method For Fabricating A Semiconductor Device With A Programmable Contact
App 20210265476 - HUANG; Chin-Ling | 2021-08-26 |
Semiconductor Device With Programmable Anti-fuse Feature And Method For Fabricating The Same
App 20210257297 - HUANG; Chin-Ling | 2021-08-19 |
Semiconductor device and method for manufacturing the same
Grant 11,088,078 - Huang August 10, 2 | 2021-08-10 |
Semiconductor device with a programmable contact and method for fabricating the same
Grant 11,081,562 - Huang August 3, 2 | 2021-08-03 |
Semiconductor Device With A Programmable Contact And Method For Fabricating The Same
App 20210210611 - HUANG; Chin-Ling | 2021-07-08 |
Semiconductor Device With Fuse-detecting Structure
App 20200388571 - HUANG; CHIN-LING | 2020-12-10 |
Anti-fuse structure
Grant 10,854,545 - Huang , et al. December 1, 2 | 2020-12-01 |
Semiconductor Device And Method For Manufacturing The Same
App 20200373246 - HUANG; CHIN-LING | 2020-11-26 |
Antifuse Structure
App 20200020705 - HUANG; CHIN-LING ; et al. | 2020-01-16 |
Antifuse structure
Grant 10,522,556 - Huang , et al. Dec | 2019-12-31 |
Semiconductor device and method for fabricating thereof
Grant 8,648,407 - Wu , et al. February 11, 2 | 2014-02-11 |
Semiconductor Device And Method For Fabricating Thereof
App 20130181277 - Wu; Tieh-Chiang ; et al. | 2013-07-18 |
Transistor Structure And Method For Preparing The Same
App 20120235228 - Huang; Chin Ling ; et al. | 2012-09-20 |
Processor And Early-load Method Thereof
App 20100049947 - Chang; Shun-Chieh ; et al. | 2010-02-25 |
Device and method for detecting alignment of active areas and memory cell structures in DRAM devices
Grant 7,381,575 - Wu , et al. June 3, 2 | 2008-06-03 |
Misalignment test structure and method thereof
Grant 7,217,581 - Huang , et al. May 15, 2 | 2007-05-15 |
Memory device and fabrication method thereof
Grant 7,091,545 - Wu , et al. August 15, 2 | 2006-08-15 |
Misalignment test structure and method thereof
App 20060128041 - Huang; Chien-Chang ; et al. | 2006-06-15 |
Device and method for detecting alignment of active areas and memory cell structures in DRAM devices
Grant 7,026,647 - Wu , et al. April 11, 2 | 2006-04-11 |
Misalignment test structure and method thereof
Grant 7,015,050 - Huang , et al. March 21, 2 | 2006-03-21 |
Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal
Grant 6,984,534 - Wu , et al. January 10, 2 | 2006-01-10 |
Device and method for detecting alignment of active areas and memory cell structures in dram devices
App 20050184289 - Wu, Tie Jiang ; et al. | 2005-08-25 |
Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices
Grant 6,902,942 - Wu , et al. June 7, 2 | 2005-06-07 |
Memory device and fabrication method thereof
App 20050104109 - Wu, Tieh Chiang ; et al. | 2005-05-19 |
Test structure of DRAM
Grant 6,891,216 - Huang , et al. May 10, 2 | 2005-05-10 |
Memory device and fabrication method thereof
Grant 6,875,654 - Wu , et al. April 5, 2 | 2005-04-05 |
Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal
Grant 6,844,207 - Wu , et al. January 18, 2 | 2005-01-18 |
Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal
App 20040179409 - Wu, Tie Jiang ; et al. | 2004-09-16 |
Misalignment test structure and method thereof
App 20040124412 - Huang, Chien-Chang ; et al. | 2004-07-01 |
Memory device and fabrication method thereof
App 20040115927 - Wu, Tieh Chiang ; et al. | 2004-06-17 |
Device and method for detecting alignment of active areas and memory cell structures in dram devices
App 20040082087 - Wu, Tie Jiang ; et al. | 2004-04-29 |
Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices
App 20040069989 - Wu, Tie Jiang ; et al. | 2004-04-15 |
Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal
App 20040029301 - Wu, Tie Jiang ; et al. | 2004-02-12 |
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