loadpatents
name:-0.018526077270508
name:-0.014414072036743
name:-0.01262092590332
HU; Chun-Ming Patent Filings

HU; Chun-Ming

Patent Applications and Registrations

Patent applications and USPTO patent grants for HU; Chun-Ming.The latest application filed is for "coolant distribution unit".

Company Profile
6.11.15
  • HU; Chun-Ming - New Taipei City TW
  • HU; Chun-Ming - Hsinchu TW
  • Hu; Chun-Ming - Hsin-Chu City TW
  • Hu; Chun-Ming - Hsin-Chu TW
  • Hu; Chun-Ming - Hsinchu City TW
  • Hu; Chun-Ming - Tainan TW
  • Hu; Chun-Ming - Tainan City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Coolant Distribution Unit
App 20220248570 - CHEN; Chien-Yu ;   et al.
2022-08-04
System And Method For Overlay Error Reduction
App 20220100103 - CHIEN; Hung-Chung ;   et al.
2022-03-31
System and method for overlay error reduction
Grant 11,287,746 - Chien , et al. March 29, 2
2022-03-29
Forecasting wafer defects using frequency domain analysis
Grant 10,867,116 - Chang , et al. December 15, 2
2020-12-15
Noise Reduction for Overlay Control
App 20200310255 - Hu; Weimin ;   et al.
2020-10-01
Noise reduction for overlay control
Grant 10,684,556 - Hu , et al.
2020-06-16
Forecasting Wafer Defects Using Frequency Domain Analysis
App 20200125785 - Chang; Yang-Hung ;   et al.
2020-04-23
Forecasting wafer defects using frequency domain analysis
Grant 10,521,548 - Chang , et al. Dec
2019-12-31
Noise Reduction for Overlay Control
App 20190258179 - Hu; Weimin ;   et al.
2019-08-22
Noise reduction for overlay control
Grant 10,281,827 - Hu , et al.
2019-05-07
Forecasting Wafer Defects Using Frequency Domain Analysis
App 20180330040 - Chang; Yang-Hung ;   et al.
2018-11-15
Forecasting wafer defects using frequency domain analysis
Grant 10,031,997 - Chang , et al. July 24, 2
2018-07-24
Forecasting Wafer Defects Using Frequency Domain Analysis
App 20180196911 - Chang; Yang-Hung ;   et al.
2018-07-12
Noise Reduction for Overlay Control
App 20180173110 - Hu; Weimin ;   et al.
2018-06-21
Method of making a semiconductor device using multiple layer sets
Grant 9,455,156 - Yen , et al. September 27, 2
2016-09-27
Method Of Making A Semiconductor Device Using Multiple Layer Sets
App 20160013071 - YEN; Bi-Ming ;   et al.
2016-01-14
Method of making a semiconductor device using multiple layer sets
Grant 9,159,580 - Yen , et al. October 13, 2
2015-10-13
Systems and methods for similarity-based semiconductor process control
Grant 9,070,622 - Ke , et al. June 30, 2
2015-06-30
Systems And Methods For Similarity-based Semiconductor Process Control
App 20150079700 - Ke; Chih-Ming ;   et al.
2015-03-19
Method Of Making A Semiconductor Device Using Multiple Layer Sets
App 20140167227 - YEN; Bi-Ming ;   et al.
2014-06-19
Method for swapping display contents between multiple screens
Grant 8,352,879 - Leung , et al. January 8, 2
2013-01-08
Method For Swapping Display Contents Between Multiple Screens
App 20110296343 - Leung; Chee-Chun ;   et al.
2011-12-01
Exposure system and method
Grant 7,301,603 - Chen , et al. November 27, 2
2007-11-27
Exposure system and method
App 20060008715 - Chen; Kai-Hsiung ;   et al.
2006-01-12
System and method for predicting a parameter for a lithography overlay first lot
App 20050209818 - Chao, Hung-Shun ;   et al.
2005-09-22
Control of exposure energy on a substrate
App 20050197721 - Chen, Yung-Cheng ;   et al.
2005-09-08

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed