Hsueh; Ming-Kai
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hsueh; Ming-Kai.The latest application filed is for "image inspection method".
- Hsueh; Ming-Kai - Tao-Yuan TW
- HSUEH; Ming-Kai - Tao-Yuan City TW
- Hsueh; Ming-Kai - Tao-Yuan Hsien N/A TW
| Patent | Date |
|---|---|
| Optical detecting device and calibrating method Grant 11,209,371 - Liu , et al. December 28, 2 | 2021-12-28 |
| Image inspection method Grant 11,080,860 - Chen , et al. August 3, 2 | 2021-08-03 |
| Image Inspection Method App 20200211199 - CHEN; Ting-Wei ; et al. | 2020-07-02 |
| Optical Detecting Device And Calibrating Method App 20200191724 - LIU; Yu-Hsin ; et al. | 2020-06-18 |
| Method for detecting a surface pattern of a solar cell Grant 9,116,135 - Cheng , et al. August 25, 2 | 2015-08-25 |
| Method For Detecting A Surface Pattern Of A Solar Cell App 20130223747 - CHENG; WEN-WEI ; et al. | 2013-08-29 |
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