loadpatents
name:-0.10589003562927
name:-0.00972580909729
name:-0.010967969894409
Hsueh; Hsiu-Wen Patent Filings

Hsueh; Hsiu-Wen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hsueh; Hsiu-Wen.The latest application filed is for "diffusion barrier layer for conductive via to decrease contact resistance".

Company Profile
8.8.15
  • Hsueh; Hsiu-Wen - Taichung City TW
  • Hsueh; Hsiu-Wen - Taichung TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Diffusion Barrier Layer For Conductive Via To Decrease Contact Resistance
App 20220310526 - Hsueh; Hsiu-Wen ;   et al.
2022-09-29
Self-Aligned Scheme for Semiconductor Device and Method of Forming the Same
App 20220277991 - Hsueh; Hsiu-Wen ;   et al.
2022-09-01
E-fuse enhancement by underlayer layout design
Grant 11,410,926 - Fu , et al. August 9, 2
2022-08-09
Diffusion barrier layer for conductive via to decrease contact resistance
Grant 11,362,035 - Hsueh , et al. June 14, 2
2022-06-14
Self-aligned scheme for semiconductor device and method of forming the same
Grant 11,342,222 - Hsueh , et al. May 24, 2
2022-05-24
Semiconductor Device Structure With Resistive Element
App 20220130727 - HUANG; Wen-Sheh ;   et al.
2022-04-28
Method for forming semiconductor device with resistive element
Grant 11,217,482 - Huang , et al. January 4, 2
2022-01-04
Inter-wire Cavity For Low Capacitance
App 20210335655 - Hsueh; Hsiu-Wen ;   et al.
2021-10-28
Barrier Free Interface Between Beol Interconnects
App 20210335663 - Hsueh; Hsiu-Wen ;   et al.
2021-10-28
Diffusion Barrier Layer For Conductive Via To Decrease Contact Resistance
App 20210287994 - Hsueh; Hsiu-Wen ;   et al.
2021-09-16
Semiconductor Device Structure With Resistive Elements
App 20210249251 - HSUEH; Hsiu-Wen ;   et al.
2021-08-12
Structure and formation method of semiconductor device with resistive elements
Grant 10,985,011 - Hsueh , et al. April 20, 2
2021-04-20
E-Fuse Enhancement By Underlayer Layout Design
App 20210098372 - Fu; An-Jiao ;   et al.
2021-04-01
Self-Aligned Scheme for Semiconductor Device and Method of Forming the Same
App 20210098290 - Hsueh; Hsiu-Wen ;   et al.
2021-04-01
Method For Forming Semiconductor Device With Resistive Element
App 20200118876 - HUANG; Wen-Sheh ;   et al.
2020-04-16
Structure and formation method of semiconductor device with resistive element
Grant 10,515,852 - Huang , et al. Dec
2019-12-24
Structure And Formation Method Of Semiconductor Device With Resistive Elements
App 20190139754 - HSUEH; Hsiu-Wen ;   et al.
2019-05-09
Structure And Formation Method Of Semiconductor Device With Resistive Element
App 20190139826 - HUANG; Wen-Sheh ;   et al.
2019-05-09
Resistive capacitance determination method for multiple-patterning-multiple spacer integrated circuit layout
Grant 9,922,162 - Ho , et al. March 20, 2
2018-03-20
Resistive Capacitance Determination Method For Multiple-patterning-multiple Spacer Integrated Circuit Layout
App 20160103948 - HO; Chia-Ming ;   et al.
2016-04-14
Resistive capacitance determination method for multiple-patterning-multiple spacer integrated circuit layout
Grant 9,218,448 - Ho , et al. December 22, 2
2015-12-22
Resistive Capacitance Determination Method For Multiple-patterning-multiple Spacer Integrated Circuit Layout
App 20150205905 - HO; Chia-Ming ;   et al.
2015-07-23
Metal Oxide Thin Film Transistor And Manufacturing Method Thereof
App 20120112180 - ZAN; HSIAO-WEN ;   et al.
2012-05-10

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