Hsu; Yu-Hsun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hsu; Yu-Hsun.The latest application filed is for "probe station".

Company Profile

3.7.7

Hsu; Yu-Hsun - Hsinchu County TW
Hsu; Yu-Hsun - Chu-pei TW
Hsu; Yu-Hsun - Chu-pei City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Wafer inspection method and wafer probing system Grant 11,353,501 - Chih , et al. June 7, 2	2022-06-07
Probe station capable of maintaining position of probe tip upon temperature change Grant 11,313,883 - Hsu , et al. April 26, 2	2022-04-26
Method for compensating to distance between probe tip and device under test after temperature changes Grant 11,287,475 - Kanev , et al. March 29, 2	2022-03-29
Probe Station App 20220074972 - HSU; Yu-Hsun ; et al.	2022-03-10
Method For Compensating To Distance Between Probe Tip And Device Under Test After Temperature Changes App 20210382108 - KANEV; Stojan ; et al.	2021-12-09
Wafer inspection method and wafer probing system Grant 10,976,363 - Chih , et al. April 13, 2	2021-04-13
Wafer Inspection Method And Wafer Probing System App 20210055344 - Chih; Lin-Lin ; et al.	2021-02-25
Wafer probe station Grant 10,895,587 - Hsu , et al. January 19, 2	2021-01-19
Wafer Probe Station App 20200209279 - HSU; Yu-Hsun ; et al.	2020-07-02
Wafer Inspection Method And Wafer Probing System App 20190187206 - Chih; Lin-Lin ; et al.	2019-06-20
Method for compensating probe misplacement and probe apparatus Grant 10,312,123 - Chen , et al.	2019-06-04
Testing machine and operation method thereof Grant 9,958,477 - Hsu , et al. May 1, 2	2018-05-01
Method For Compensating Probe Misplacement And Probe Apparatus App 20170219650 - Chen; Chen-Ching ; et al.	2017-08-03
Testing Machine And Operation Method Thereof App 20160266168 - HSU; Yu-Hsun ; et al.	2016-09-15

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.