Hsu; Yi-Chang
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hsu; Yi-Chang.The latest application filed is for "control device having output pin expansion function and output pin expansion method".
- Hsu; Yi-Chang - Taipei TW
- Hsu; Yi-Chang - Jhonghe TW
- Hsu; Yi-Chang - Taipei County TW
- Hsu; Yi-Chang - Jhonghe City TW
- Hsu; Yi Chang - BanChiao TW
- Hsu; Yi Chang - BanChiao City TW
| Patent | Date |
|---|---|
| Output pin expansion using shift register receiving data bit each software counted clock for parallel output strobe Grant 8,307,126 - Hsu , et al. November 6, 2 | 2012-11-06 |
| Framework of wireless network access device Grant 8,228,683 - Hsu , et al. July 24, 2 | 2012-07-24 |
| Circuit testing apparatus Grant 8,228,384 - Teng , et al. July 24, 2 | 2012-07-24 |
| Test system Grant 8,037,089 - Teng , et al. October 11, 2 | 2011-10-11 |
| Signal transmission line connector Grant D621,359 - Hsu , et al. August 10, 2 | 2010-08-10 |
| Framework Of Wireless Network Access Device App 20100167647 - Hsu; Yi-Chang ; et al. | 2010-07-01 |
| Control Device Having Output Pin Expansion Function and Output Pin Expansion Method App 20100169697 - Hsu; Yi-Chang ; et al. | 2010-07-01 |
| Test System App 20090113260 - TENG; Cheng-Yung ; et al. | 2009-04-30 |
| Interface circuit for using a low voltage logic tester to test a high voltage IC Grant 7,383,477 - Teng , et al. June 3, 2 | 2008-06-03 |
| Circuit Testing Apparatus App 20080063212 - Teng; Cheng-Yung ; et al. | 2008-03-13 |
| Circuit Testing Apparatus App 20070268037 - Teng; Cheng-Yung ; et al. | 2007-11-22 |
| Interace circuit for using a low voltage logic tester to test a high voltage IC App 20070168787 - Teng; Cheng Yung ; et al. | 2007-07-19 |
| Test system and single-chip tester capable of testing a plurality of chips simultaneously App 20070024314 - Teng; Cheng-Yung ; et al. | 2007-02-01 |
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