Hsu; Tyng-Hao

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hsu; Tyng-Hao.The latest application filed is for "system and method for inspecting errors on a wafer".

Company Profile

0.6.5

Hsu; Tyng-Hao - Hsin-chu TW
Hsu; Tyng-Hao - Hsinchu TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for inspecting errors on a wafer Grant 7,469,057 - Hung , et al. December 23, 2	2008-12-23
Progressive self-learning defect review and classification method Grant 7,162,071 - Hung , et al. January 9, 2	2007-01-09
Method for applying a defect finder mark to a backend photomask making process Grant 7,035,449 - Hung , et al. April 25, 2	2006-04-25
Increased-contrast film for high-transmittance attenuated phase-shaft masks Grant 6,858,353 - Chang , et al. February 22, 2	2005-02-22
System and method for inspecting errors on a wafer App 20040165761 - Hung, Chang-Cheng ; et al.	2004-08-26
Progressive self-learning defect review and classification method App 20040120569 - Hung, Chang-Cheng ; et al.	2004-06-24
Electron beam shot linearity monitoring Grant 6,721,939 - Wang , et al. April 13, 2	2004-04-13
Increased-contrast film for high-transmittance attenuated phase-shaft masks App 20040013947 - Chang, Chia-Yang ; et al.	2004-01-22
Electron beam shot linearity monitoring App 20030159125 - Wang, Wen-Chuan ; et al.	2003-08-21
Method for applying a defect finder mark to a backend photomask making process App 20030095699 - Hung, Chang Cheng ; et al.	2003-05-22
Method for checking accuracy of a measuring instrument for overlay registration Grant 6,127,075 - Hsu October 3, 2	2000-10-03

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