loadpatents
Patent applications and USPTO patent grants for Hsu; Ting-Hao.The latest application filed is for "bicycle head and bicycle shift control box".
Patent | Date |
---|---|
Semiconductor device and operation method thereof Grant 11,411,535 - Hwu , et al. August 9, 2 | 2022-08-09 |
Bicycle Head And Bicycle Shift Control Box App 20220081059 - LIAO; Bo-Yi ;   et al. | 2022-03-17 |
System and method for localized EUV pellicle glue removal Grant 11,079,669 - Chou , et al. August 3, 2 | 2021-08-03 |
Semiconductor Device And Operation Method Thereof App 20210211097 - HWU; Jenn-Gwo ;   et al. | 2021-07-08 |
Lithography Method With Reduced Impacts of Mask Defects App 20210208505 - Yu; Shinn-Sheng ;   et al. | 2021-07-08 |
Method Of Fast Surface Particle And Scratch Detection For Euv Mask Backside App 20210200077 - CHEN; Chih-Cheng ;   et al. | 2021-07-01 |
Lithography method with reduced impacts of mask defects Grant 10,955,746 - Yu , et al. March 23, 2 | 2021-03-23 |
Semiconductor device and operation method thereof Grant 10,958,216 - Hwu , et al. March 23, 2 | 2021-03-23 |
Semiconductor Device And Operation Method Thereof App 20210058034 - HWU; Jenn-Gwo ;   et al. | 2021-02-25 |
Pellicle for advanced lithography Grant 10,691,017 - Lee , et al. | 2020-06-23 |
System and Method for Localized EUV Pellicle Glue Removal App 20200150523 - Chou; Tzu-Ting ;   et al. | 2020-05-14 |
System and method for localized EUV pellicle glue removal Grant 10,520,805 - Chou , et al. Dec | 2019-12-31 |
Pellicle for Advanced Lithography App 20190072849 - Lee; Yu-Ching ;   et al. | 2019-03-07 |
Lithography Method with Reduced Impacts of Mask Defects App 20190033720 - Yu; Shinn-Sheng ;   et al. | 2019-01-31 |
Pellicle for advanced lithography Grant 10,126,644 - Lee , et al. November 13, 2 | 2018-11-13 |
Pellicle aging estimation and particle removal from pellicle via acoustic waves Grant 9,933,699 - Lee , et al. April 3, 2 | 2018-04-03 |
System and Method for Localized EUV Pellicle Glue Removal App 20180031962 - Chou; Tzu-Ting ;   et al. | 2018-02-01 |
Pellicle For Advanced Lithography App 20170227843 - Lee; Yu-Ching ;   et al. | 2017-08-10 |
Mask pellicle indicator for haze prevention Grant 9,658,526 - Lin , et al. May 23, 2 | 2017-05-23 |
Method for integrated circuit fabrication Grant 9,548,209 - Yu , et al. January 17, 2 | 2017-01-17 |
Mask Pellicle Indicator for Haze Prevention App 20170003585 - Lin; Kuan-Wen ;   et al. | 2017-01-05 |
Pellicle Aging Estimation And Particle Removal From Pellicle Via Acoustic Waves App 20160274471 - Lee; Yu-Ching ;   et al. | 2016-09-22 |
Lithography system and method for haze elimination Grant 9,418,847 - Shen , et al. August 16, 2 | 2016-08-16 |
EUV mask and method for forming the same Grant 9,354,510 - Yu , et al. May 31, 2 | 2016-05-31 |
Method and apparatus for efficient defect inspection Grant 9,305,346 - Yu , et al. April 5, 2 | 2016-04-05 |
Lithographic photomask with inclined sides Grant 9,152,035 - Yu , et al. October 6, 2 | 2015-10-06 |
Lithography System And Method For Haze Elimination App 20150212419 - Shen; Ching-Wei ;   et al. | 2015-07-30 |
Method for Integrated Circuit Fabrication App 20150162204 - Yu; Ching-Fang ;   et al. | 2015-06-11 |
Lithographic Photomask With Inclined Sides App 20150104731 - Yu; Ching-Fang ;   et al. | 2015-04-16 |
Method For Integrated Circuit Fabrication App 20150099364 - Yu; Ching-Fang ;   et al. | 2015-04-09 |
Method for integrated circuit fabrication Grant 8,980,108 - Yu , et al. March 17, 2 | 2015-03-17 |
Device manufacturing and cleaning method Grant 8,932,958 - Lu , et al. January 13, 2 | 2015-01-13 |
EUV Mask and Method for Forming the Same App 20140205938 - Yu; Ching-Fang ;   et al. | 2014-07-24 |
Method and apparatus for defect identification Grant 8,737,717 - Lin , et al. May 27, 2 | 2014-05-27 |
EUV mask and method for forming the same Grant 8,691,476 - Yu , et al. April 8, 2 | 2014-04-08 |
Device Manufacturing And Cleaning Method App 20140051252 - Lu; Chi-Lun ;   et al. | 2014-02-20 |
System and method for combined intraoverlay metrology and defect inspection Grant 8,656,318 - Lee , et al. February 18, 2 | 2014-02-18 |
Method And Apparatus For Efficient Defect Inspection App 20130322736 - Yu; Ching-Fang ;   et al. | 2013-12-05 |
Device Manufacturing And Cleaning Method App 20130323931 - Lu; Chi-Lun ;   et al. | 2013-12-05 |
Device manufacturing and cleaning method Grant 8,598,042 - Lu , et al. December 3, 2 | 2013-12-03 |
System and Method for Combined Intraoverlay and Defect Inspection App 20130298088 - Lee; Hsin-Chang ;   et al. | 2013-11-07 |
Method And Apparatus For Defect Identification App 20130287287 - Lin; Mei-Chun ;   et al. | 2013-10-31 |
Euv Mask And Method For Forming The Same App 20130157177 - Yu; Ching-Fang ;   et al. | 2013-06-20 |
Novel Treatment For Mask Surface Chemical Reduction App 20090258159 - Su; Yih-Chen ;   et al. | 2009-10-15 |
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