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name:-0.024389028549194
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HSU; Ming Cheng Patent Filings

HSU; Ming Cheng

Patent Applications and Registrations

Patent applications and USPTO patent grants for HSU; Ming Cheng.The latest application filed is for "system, apparatus, and method for a convertible child high-chair and step stool".

Company Profile
4.24.18
  • HSU; Ming Cheng - Taipei TW
  • Hsu; Ming-Cheng - Hsinchu TW
  • Hsu; Ming-Cheng - Hsin-Chu TW
  • HSU; MING-CHENG - HSIN-CHU CITY TW
  • HSU; Ming-Cheng - Hsinchu City TW
  • Hsu; Ming-Cheng - New Taipei TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
System, Apparatus, And Method For A Convertible Child High-chair And Step Stool
App 20220257022 - DZIAK; Daniel Emil ;   et al.
2022-08-18
System, apparatus, and method for a convertible child high-chair and step stool
Grant 11,259,648 - Dziak , et al. March 1, 2
2022-03-01
Probe head structure of probe card and testing method
Grant 11,199,576 - Hsu , et al. December 14, 2
2021-12-14
System, Apparatus, And Method For A Convertible Child High-chair And Step Stool
App 20210161306 - Dziak; Daniel Emil ;   et al.
2021-06-03
System, apparatus, and method for a convertible child high-chair and step stool
Grant 10,932,588 - Dziak , et al. March 2, 2
2021-03-02
Probe head receiver and probe card assembly having the same
Grant 10,866,266 - Hsu December 15, 2
2020-12-15
Probe Head Structure Of Probe Card And Testing Method
App 20190242942 - Hsu; Ming-Cheng ;   et al.
2019-08-08
System, Apparatus, And Method For A Convertible Child High-chair And Step Stool
App 20190231087 - Dziak; Daniel Emil ;   et al.
2019-08-01
Probe head structure of probe card and testing method
Grant 10,267,847 - Hsu , et al.
2019-04-23
Probe card
Grant 10,088,503 - Hsu October 2, 2
2018-10-02
Probe Card Structure
App 20170363658 - Hsu; Ming-Cheng ;   et al.
2017-12-21
Membrane probe card
Grant 9,709,599 - Hsu July 18, 2
2017-07-18
Probe card
Grant 9,678,109 - Hsu June 13, 2
2017-06-13
Probe Head Receiver And Probe Card Assembly Having The Same
App 20170122984 - HSU; MING-CHENG
2017-05-04
Probe head, probe card assembly using the same, and manufacturing method thereof
Grant 9,535,091 - Hsu , et al. January 3, 2
2017-01-03
Probe Head, Probe Card Assembly Using The Same, And Manufacturing Method Thereof
App 20160274147 - HSU; Ming-Cheng ;   et al.
2016-09-22
Universal probe card PCB design
Grant 9,372,205 - Hsu June 21, 2
2016-06-21
Probe card for probing integrated circuits
Grant 9,207,259 - Hsu December 8, 2
2015-12-08
Probe Card
App 20150241471 - Hsu; Ming-Cheng
2015-08-27
Universal Probe Card PCB Design
App 20150198631 - Hsu; Ming-Cheng
2015-07-16
Membrane Probe Card
App 20150192609 - Hsu; Ming-Cheng
2015-07-09
Probe Card
App 20150192608 - Hsu; Ming-Cheng
2015-07-09
Light emitting diode lamp
Grant D691,294 - Hsu , et al. October 8, 2
2013-10-08
Light emitting diode lamp
Grant D690,037 - Lee , et al. September 17, 2
2013-09-17
Light emitting diode lamp
Grant D687,174 - Hsu , et al. July 30, 2
2013-07-30
Light emitting diode lamp
Grant D679,843 - Hsu , et al. April 9, 2
2013-04-09
Light emitting diode lamp
Grant D679,034 - Lee , et al. March 26, 2
2013-03-26
Probe Card for Probing Integrated Circuits
App 20120313659 - Hsu; Ming Cheng
2012-12-13
Method for fabricating a semiconductor test probe card space transformer
Grant 8,322,020 - Hsu , et al. December 4, 2
2012-12-04
Method for assembling a wafer level test probe card
Grant 8,146,245 - Chao , et al. April 3, 2
2012-04-03
Method For Fabricating A Semiconductor Test Probe Card Space Transformer
App 20120017428 - HSU; Ming Cheng ;   et al.
2012-01-26
Method for fabricating a semiconductor test probe card space transformer
Grant 8,033,012 - Hsu , et al. October 11, 2
2011-10-11
Wafer Level Test Probe Card
App 20100229383 - Chao; Clinton Chih-Chieh ;   et al.
2010-09-16
Wafer level test probe card
Grant 7,750,651 - Chao , et al. July 6, 2
2010-07-06
Test Probe Card Space Transformer
App 20090223043 - Hsu; Ming Cheng ;   et al.
2009-09-10
Wafer Level Test Probe Card
App 20090224780 - Chao; Clinton Chih-Chieh ;   et al.
2009-09-10
Universal Array Type Probe Card Design For Semiconductor Device Testing
App 20080094093 - Hsu; Ming-Cheng ;   et al.
2008-04-24
Probe card for flip chip testing
App 20080036483 - Hsu; Ming-Cheng
2008-02-14
GPS (global positioning system) receiver
Grant D540,205 - Hsu April 10, 2
2007-04-10

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