Patent | Date |
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Data first-in first-out (FIFO) circuit Grant 11,100,963 - Wu , et al. August 24, 2 | 2021-08-24 |
Synchronization circuit and cascaded synchronization circuit for converting asynchronous signal into synchronous signal Grant 11,073,862 - Hsu July 27, 2 | 2021-07-27 |
Synchronization Circuit And Cascaded Synchronization Circuit For Converting Asynchronous Signal Into Synchronous Signal App 20210072785 - Hsu; Jen-Shou | 2021-03-11 |
Target row refresh mechanism capable of effectively determining target row address to effectively mitigate row hammer errors without using counter circuit Grant 10,916,293 - Lai , et al. February 9, 2 | 2021-02-09 |
Test system and device Grant 9,575,114 - Hsu , et al. February 21, 2 | 2017-02-21 |
Semiconductor memory device having compression test mode Grant 9,484,117 - Hsu November 1, 2 | 2016-11-01 |
Test System And Device App 20150019927 - HSU; Jen-Shou ;   et al. | 2015-01-15 |
Semiconductor Memory Device Having Compression Test Mode App 20140301149 - HSU; Jen-Shou | 2014-10-09 |
Repairing circuit for memory circuit and method thereof and memory circuit using the same Grant 8,472,265 - Hsu June 25, 2 | 2013-06-25 |
Delay line circuit and phase interpolation module thereof Grant 8,384,459 - Hsu February 26, 2 | 2013-02-26 |
Repairing Circuit For Memory Circuit And Method Thereof And Memory Circuit Using The Same App 20120287737 - Hsu; Jen-Shou | 2012-11-15 |
Delay Line Circuit And Phase Interpolation Module Thereof App 20120286838 - Hsu; Jen-Shou | 2012-11-15 |
Semiconductor memory device and method of testing the same Grant 8,289,795 - Hsu October 16, 2 | 2012-10-16 |
Memory testing system and memory module thereof Grant 7,817,485 - Hsu , et al. October 19, 2 | 2010-10-19 |
Trigger circuit of a column redundant circuit and related column redundant device Grant 7,796,448 - Hsu September 14, 2 | 2010-09-14 |
Charge pump circuit for high voltage generation Grant 7,741,898 - Hsu June 22, 2 | 2010-06-22 |
Method for detecting erroneous word lines of a memory array and device thereof Grant 7,623,388 - Chen , et al. November 24, 2 | 2009-11-24 |
Memory testing system and memory module thereof App 20090273996 - Hsu; Jen-Shou ;   et al. | 2009-11-05 |
Trigger Circuit of a Column Redundant Circuit and Related Column Redundant Device App 20090268530 - Hsu; Jen-Shou | 2009-10-29 |
Charge pump circuit control system Grant 7,570,104 - Hsu August 4, 2 | 2009-08-04 |
Method for detecting erroneous word lines of a memory array and device thereof App 20090175097 - Chen; Tzu-Hao ;   et al. | 2009-07-09 |
Decoupling capacitor circuit Grant 7,551,018 - Hsu , et al. June 23, 2 | 2009-06-23 |
Negative voltage generator Grant 7,479,775 - Hsu January 20, 2 | 2009-01-20 |
Calibrated built-in temperature sensor and calibration method thereof Grant 7,434,985 - Hsu , et al. October 14, 2 | 2008-10-14 |
Charge pump circuit for high voltage generation App 20080174360 - Hsu; Jen-Shou | 2008-07-24 |
Decoupling capacitor circuit App 20080142924 - Hsu; Jen Shou ;   et al. | 2008-06-19 |
Charge pump circuit control system App 20080074170 - Hsu; Jen Shou | 2008-03-27 |
Negative voltage generator App 20080018318 - Hsu; Jen Shou | 2008-01-24 |
Internal power management scheme for a memory chip in deep power down mode Grant 7,292,494 - Hsu , et al. November 6, 2 | 2007-11-06 |
Multiple power supplies for the driving circuit of local word line driver of DRAM Grant 7,277,315 - Yuan , et al. October 2, 2 | 2007-10-02 |
Calibrated built-in temperature sensor and calibration method thereof App 20070140308 - Hsu; Jen-Shou ;   et al. | 2007-06-21 |
Multiple power supplies for the driving circuit of local word line driver of DRAM App 20070133317 - Yuan; Der-Min ;   et al. | 2007-06-14 |
Internal power management scheme for a memory chip in deep power down mode App 20060146636 - Hsu; Jen-Shou ;   et al. | 2006-07-06 |
Speeding up the power-up procedure for low power RAM Grant 7,002,870 - Hsu February 21, 2 | 2006-02-21 |
Speeding Up The Power-up Procedure For Low Power Ram App 20050270881 - Hsu, Jen-Shou | 2005-12-08 |