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Patent applications and USPTO patent grants for HSU; Hsing-Piao.The latest application filed is for "broadband wafer defect detection".
Patent | Date |
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Broadband Wafer Defect Detection App 20210333220 - CHENG; Nai-Han ;   et al. | 2021-10-28 |
Ion Implantation Gas Supply System App 20210319978 - Hsu; Hsing-Piao ;   et al. | 2021-10-14 |
Ion impantation gas supply system Grant 11,081,315 - Hsu , et al. August 3, 2 | 2021-08-03 |
Broadband wafer defect detection Grant 11,060,980 - Cheng , et al. July 13, 2 | 2021-07-13 |
Ion Impantation Gas Supply System App 20200395193 - HSU; Hsing-Piao ;   et al. | 2020-12-17 |
Broadband Wafer Defect Detection App 20190162676 - CHENG; Nai-Han ;   et al. | 2019-05-30 |
Ion beam source for semiconductor ion implantation Grant 10,269,530 - Hsu , et al. | 2019-04-23 |
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