Hsieh; Ting-Hua

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hsieh; Ting-Hua.The latest application filed is for "gate structure of a semiconductor device and method of making".

Company Profile

6.8.6

Hsieh; Ting-Hua - Hsinchu TW
HSIEH; Ting-Hua - Hsinchu City TW
Hsieh; Ting-Hua - Hsin-chu TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Gate structure of a semiconductor device and method of making Grant 11,380,775 - Zhu , et al. July 5, 2	2022-07-05
Overlay error and process window metrology Grant 10,879,135 - Fang , et al. December 29, 2	2020-12-29
Gate Structure Of A Semiconductor Device And Method Of Making App 20200168721 - ZHU; Ming ; et al.	2020-05-28
Overlay Error And Process Window Metrology App 20200118893 - FANG; Shang-Wei ; et al.	2020-04-16
Gate structure of a semiconductor device Grant 10,553,699 - Zhu , et al. Fe	2020-02-04
Overlay error and process window metrology Grant 10,510,623 - Fang , et al. Dec	2019-12-17
Overlay Error And Process Window Metrology App 20190198403 - FANG; Shang-Wei ; et al.	2019-06-27
Gate Structure Of A Semiconductor Device App 20180277654 - ZHU; Ming ; et al.	2018-09-27
Method of forming gate structure of a semiconductor device Grant 9,978,853 - Zhu , et al. May 22, 2	2018-05-22
Method Of Forming Gate Structure Of A Semiconductor Device App 20170186853 - ZHU; Ming ; et al.	2017-06-29
Metal gate structure of a semiconductor device Grant 9,595,443 - Zhu , et al. March 14, 2	2017-03-14
Method for fabricating a shallow ion implanted microelectronic structure Grant 6,582,995 - Hsieh , et al. June 24, 2	2003-06-24
Method for fabricating a shallow ion implanted microelectronic structure App 20030013282 - Hsieh, Ting-Hua ; et al.	2003-01-16

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.