HSIEH; KAI-CHIEH
Patent Applications and Registrations
Patent applications and USPTO patent grants for HSIEH; KAI-CHIEH.The latest application filed is for "probe card device and dual-arm probe".
Company Profile
17.17.27
- HSIEH; KAI-CHIEH - Taoyuan City TW
- Hsieh; Kai-Chieh - Taoyuan TW
- HSIEH; KAI-CHIEH - TAOYUAN COUNTY TW
- HSIEH; KAI-CHIEH - TAOYUAN COUNTY 328 TW
Patent Activity
| Patent | Date |
|---|---|
| Probe Card Device And Dual-arm Probe App 20220170960 - HSIEH; KAI-CHIEH ; et al. | 2022-06-02 |
| Probe Card Device And Self-aligned Probe App 20220163565 - HSIEH; KAI-CHIEH ; et al. | 2022-05-26 |
| Board-like Connector, Dual-ring Bridge Of Board-like Connector, And Wafer Testing Assembly App 20220137095 - HSIEH; KAI-CHIEH ; et al. | 2022-05-05 |
| Board-like Connector, Dual-arm Bridge Of Board-like Connector, And Wafer Testing Assembly App 20220140515 - HSIEH; KAI-CHIEH ; et al. | 2022-05-05 |
| Board-like Connector, Single-arm Bridge Of Board-like Connector, And Wafer Testing Assembly App 20220137124 - HSIEH; KAI-CHIEH ; et al. | 2022-05-05 |
| Split thin-film probe card Grant 11,287,446 - Lee , et al. March 29, 2 | 2022-03-29 |
| Probe Card Device And Fence-like Probe Thereof App 20220018876 - LEE; WEN-TSUNG ; et al. | 2022-01-20 |
| Probe card device and fence-like probe thereof Grant 11,226,354 - Lee , et al. January 18, 2 | 2022-01-18 |
| Probe Card Device And Fan-out Probe Thereof App 20220011346 - LEE; WEN-TSUNG ; et al. | 2022-01-13 |
| Probe card device and neck-like probe thereof Grant 11,209,461 - Lee , et al. December 28, 2 | 2021-12-28 |
| Probe card device Grant 11,204,371 - Lee , et al. December 21, 2 | 2021-12-21 |
| Thin-film probe card and test module thereof Grant 11,175,313 - Lee , et al. November 16, 2 | 2021-11-16 |
| Staggered probe card Grant 11,175,312 - Hsieh , et al. November 16, 2 | 2021-11-16 |
| Thin-film Probe Card And Test Module Thereof App 20210349129 - LEE; WEN-TSUNG ; et al. | 2021-11-11 |
| Split Thin-film Probe Card And Elastic Module Thereof App 20210325430 - LEE; WEN-TSUNG ; et al. | 2021-10-21 |
| Probe card device Grant 11,073,537 - Lee , et al. July 27, 2 | 2021-07-27 |
| Probe Card Device And Neck-like Probe Thereof App 20210223289 - LEE; WEN-TSUNG ; et al. | 2021-07-22 |
| Probe Card Device And Directivity Probe Thereof App 20210223291 - LEE; WEN-TSUNG ; et al. | 2021-07-22 |
| High speed probe card device and rectangular probe Grant 11,009,524 - Lee , et al. May 18, 2 | 2021-05-18 |
| Probe card device and three-dimensional signal transfer structure thereof Grant 11,009,526 - Lee , et al. May 18, 2 | 2021-05-18 |
| Staggered Probe Card And Conductive Probe App 20210109129 - HSIEH; KAI-CHIEH ; et al. | 2021-04-15 |
| Probe card device Grant 10,845,385 - Lee , et al. November 24, 2 | 2020-11-24 |
| Probe card device and probe head thereof Grant 10,845,388 - Lee , et al. November 24, 2 | 2020-11-24 |
| Probe card device and matching probe thereof Grant 10,845,387 - Lee , et al. November 24, 2 | 2020-11-24 |
| Probe Card Device And Conductive Probe Thereof App 20200300893 - LEE; WEN-TSUNG ; et al. | 2020-09-24 |
| Probe card testing device and testing device Grant 10,775,412 - Lee , et al. Sept | 2020-09-15 |
| High Speed Probe Card Device And Rectangular Probe App 20200233014 - Lee; Wen-Tsung ; et al. | 2020-07-23 |
| Probe assembly and probe structure thereof Grant 10,718,791 - Hsieh , et al. | 2020-07-21 |
| Probe assembly and probe structure thereof Grant 10,705,117 - Lee , et al. | 2020-07-07 |
| Probe Card Device And Probe Head Thereof App 20200166543 - LEE; WEN-TSUNG ; et al. | 2020-05-28 |
| Probe Card Device And Matching Probe Thereof App 20200158756 - LEE; WEN-TSUNG ; et al. | 2020-05-21 |
| Probe Card Testing Device And Testing Device App 20200088764 - LEE; Wen-Tsung ; et al. | 2020-03-19 |
| Probe structure Grant 10,514,390 - Li , et al. Dec | 2019-12-24 |
| Probe Card Device And Flat Signal Transfer Structure Thereof App 20190377003 - LEE; WEN-TSUNG ; et al. | 2019-12-12 |
| Probe Card Device And Three-dimensional Signal Transfer Structure Thereof App 20190377004 - LEE; WEN-TSUNG ; et al. | 2019-12-12 |
| Probe Assembly And Probe Structure Thereof App 20190265275 - HSIEH; KAI-CHIEH ; et al. | 2019-08-29 |
| Probe Assembly And Probe Structure Thereof App 20190265274 - LEE; WEN-TSUNG ; et al. | 2019-08-29 |
| Probe device of vertical probe card Grant 10,060,949 - Li , et al. August 28, 2 | 2018-08-28 |
| Probe Device Of Vertical Probe Card App 20180059140 - LI; Wen Tsung ; et al. | 2018-03-01 |
| Probe Structure App 20180017593 - LI; Wen Tsung ; et al. | 2018-01-18 |
| Circuit Board With Via Capacitor Structure And Manufacturing Method For The Same App 20170367183 - LI; Wen Tsung ; et al. | 2017-12-21 |
| Stack Type Test Interface Board Assembly And Method For Manufacturing The Same App 20170315152 - LIN; Cheng-Juei ; et al. | 2017-11-02 |
| Multilayer Interposer With High Bonding Strength App 20160349315 - LEE; WEN-TSUNG ; et al. | 2016-12-01 |
| Fine Pitch Interposer Structure App 20140084955 - TENG; YUAN-CHIANG ; et al. | 2014-03-27 |
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