Hoyme; Werner

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hoyme; Werner.The latest application filed is for "arrangement for determining the reflectivity of a sample".

Company Profile

0.5.9

Hoyme; Werner - Gebstedt DE
Hoyme; Werner - Jena DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Arrangement for Determining the Reflectivity of a Sample App 20110007319 - Correns; Nico ; et al.	2011-01-13
Device For Optical Spectroscopy And Mechanical Switch For Such A Device App 20100321686 - Correns; Nico ; et al.	2010-12-23
Spectrometric measuring probe and method for recalibrating the same Grant 7,671,984 - Schebesta , et al. March 2, 2	2010-03-02
Spectrometric Measuring Probe and Method for Recalibrating the Same App 20070236692 - Schebesta; Wilhelm ; et al.	2007-10-11
Spectrometric measuring head for harvesting machines and other equipment used in agriculture Grant 7,265,831 - Kormann , et al. September 4, 2	2007-09-04
Pressure compensating device for optical apparatus Grant 7,082,003 - Correns , et al. July 25, 2	2006-07-25
Spectrometric measuring head for harvesting machines and other equipment used in agriculture App 20060093522 - Kormann; Georg ; et al.	2006-05-04
Gas sample vessel for a gas analyzer Grant 6,888,637 - Kerstan , et al. May 3, 2	2005-05-03
Pressure compensating device for optical apparatus App 20040027565 - Correns, Nico ; et al.	2004-02-12
Arrangement for fixing an optical component part Grant 6,654,186 - Klarner , et al. November 25, 2	2003-11-25
Optical measuring arrangement, in particular for quality control in continuous processes App 20030202180 - Gobel, Juergen ; et al.	2003-10-30
Gas sample vessel for a gas analyzer App 20030103204 - Kerstan, Felix ; et al.	2003-06-05
Arrangement for fixing an optical component part App 20020171956 - Klarner, Ullrich ; et al.	2002-11-21
Optical measuring arrangement, in particular for quality control in continuous processes App 20020001078 - Gobel, Juergen ; et al.	2002-01-03

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