Howland; William H.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Howland; William H..The latest application filed is for "wear test apparatus".

Company Profile

0.13.10

Howland; William H. - Wexford PA
Howland; William H. - Cortland OH
Howland, William H - Wexford PA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Wear test apparatus Grant 10,241,018 - Zafred , et al.	2019-03-26
Wear Test Apparatus App 20170153171 - Zafred; Paolo R. ; et al.	2017-06-01
Noncontact Sensing Of Maximum Open-circuit Voltages App 20160313388 - Howland; William H.	2016-10-27
Non-contact mobile charge measurement with leakage band-bending and dipole correction Grant 7,230,443 - Fung , et al. June 12, 2	2007-06-12
Apparatus and method for measuring semiconductor wafer electrical properties Grant 6,972,582 - Howland , et al. December 6, 2	2005-12-06
Non-contact mobile charge measurement with leakage band-bending and dipole correction Grant 6,937,050 - Fung , et al. August 30, 2	2005-08-30
Apparatus and method for determining electrical properties of a semiconductor wafer Grant 6,894,519 - Howland May 17, 2	2005-05-17
Non-invasive electrical measurement of semiconductor wafers Grant 6,842,029 - Howland January 11, 2	2005-01-11
Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer Grant 6,836,139 - Howland December 28, 2	2004-12-28
Apparatus for determining doping concentration of a semiconductor wafer Grant 6,788,076 - Howland September 7, 2	2004-09-07
Apparatus and method for measuring semiconductor wafer electrical properties App 20040155240 - Howland, William H. ; et al.	2004-08-12
Non-contact mobile charge measurement with leakage band-bending and dipole correction Grant 6,771,092 - Fung , et al. August 3, 2	2004-08-03
Method of detecting carrier dose of a semiconductor wafer App 20040108869 - Howland, William H ; et al.	2004-06-10
Method of determining one or more properties of a semiconductor wafer Grant 6,741,093 - Howland , et al. May 25, 2	2004-05-25
Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer App 20040075460 - Howland, William H.	2004-04-22
Apparatus for determining doping concentration of a semiconductor wafer App 20040008033 - Howland, William H.	2004-01-15
Non-invasive electrical measurement of semiconductor wafers App 20030227292 - Howland, William H.	2003-12-11
High speed threshold voltage and average surface doping measurements Grant 6,657,454 - Howland December 2, 2	2003-12-02
Apparatus and method for determining electrical properties of a semiconductor wafer App 20030210066 - Howland, William H.	2003-11-13
Apparatus and method for determining doping concentration of a semiconductor wafer Grant 6,632,691 - Howland October 14, 2	2003-10-14
High speed threshold voltage and average surface doping measurements App 20030173988 - Howland, William H.	2003-09-18
Non-contact mobile charge measurement with leakage band-bending and dipole correction Grant 6,522,158 - Fung , et al. February 18, 2	2003-02-18
Method of detecting carrier dose of a semiconductor wafer App 20020180474 - Howland, William H. ; et al.	2002-12-05

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.