Howland, Jr.; William H.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Howland, Jr.; William H..The latest application filed is for "in-situ wafer and probe desorption using closed loop heating".

Company Profile

0.10.0

Howland, Jr.; William H. - Wexford PA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
In-situ wafer and probe desorption using closed loop heating Grant 7,304,490 - Howland, Jr. , et al. December 4, 2	2007-12-04
Method of measuring semiconductor wafers with an oxide enhanced probe Grant 7,282,941 - Howland, Jr. October 16, 2	2007-10-16
Method of detecting un-annealed ion implants Grant 7,250,313 - Howland, Jr. July 31, 2	2007-07-31
Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer Grant 7,190,186 - Howland, Jr. , et al. March 13, 2	2007-03-13
Semiconductor substrate surface preparation using high temperature convection heating Grant 7,063,992 - Adams , et al. June 20, 2	2006-06-20
Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer Grant 7,026,837 - Howland, Jr. , et al. April 11, 2	2006-04-11
Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof Grant 7,023,231 - Howland, Jr. , et al. April 4, 2	2006-04-04
Method and apparatus for removing and/or preventing surface contamination of a probe Grant 7,007,408 - Howland, Jr. , et al. March 7, 2	2006-03-07
Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer Grant 7,005,307 - Howland, Jr. , et al. February 28, 2	2006-02-28
Sample chuck with compound construction Grant 6,803,780 - Adams , et al. October 12, 2	2004-10-12

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.