| Patent | Date |
|---|
Radiation Detection Systems And Methods
App 20220206170 - HOSSAIN; TIM Z ; et al. | 2022-06-30 |
Fuel cell catalyst regeneration
Grant 8,440,357 - Hossain , et al. May 14, 2 | 2013-05-14 |
Fuel Cell Catalyst Regeneration
App 20110236773 - Hossain; Tim Z. ; et al. | 2011-09-29 |
Fuel cell catalyst regeneration
Grant 7,981,825 - Hossain , et al. July 19, 2 | 2011-07-19 |
Heat Removal Facilitated With Diamond-like Carbon Layer In Soi Structures
App 20100059762 - Hossain; Tim Z. ; et al. | 2010-03-11 |
Arrayed neutron detector with multi shielding allowing for discrimination between radiation types
Grant 7,645,993 - Gazda , et al. January 12, 2 | 2010-01-12 |
Fuel Cell Catalyst Regeneration
App 20090246584 - Hossain; Tim Z. ; et al. | 2009-10-01 |
Arrayed Neutron Detector With Multi Shielding Allowing For Discrimination Between Radiation Types
App 20090166550 - Gazda; Jerzy ; et al. | 2009-07-02 |
Fuel Cell Using Deuterium
App 20090029202 - Hossain; Tim Z. ; et al. | 2009-01-29 |
Sub-cap and method of manufacture therefor in integrated circuit capping layers
Grant 6,515,367 - Bernard , et al. February 4, 2 | 2003-02-04 |
System and method for analyzing layers using x-ray transmission
Grant 6,434,217 - Pickelsimer , et al. August 13, 2 | 2002-08-13 |
Sub-cap and method of manufacture therefor in integrated circuit capping layers
Grant 6,406,996 - Bernard , et al. June 18, 2 | 2002-06-18 |
Thin titanium film as self-regulating filter for silicon migration into aluminum metal lines
Grant 6,191,032 - Tiffin , et al. February 20, 2 | 2001-02-20 |
Depth profile metrology using grazing incidence X-ray fluorescence
Grant 6,173,036 - Hossain , et al. January 9, 2 | 2001-01-09 |
Apparatus and method for determining depth profile characteristics of a dopant material in a semiconductor device
Grant 6,151,119 - Campion , et al. November 21, 2 | 2000-11-21 |
Boron implanted dielectric structure
Grant 6,097,079 - Hossain , et al. August 1, 2 | 2000-08-01 |
Neutron detecting semiconductor device
Grant 6,075,261 - Hossain , et al. June 13, 2 | 2000-06-13 |
Method and apparatus for the molecular identification of defects in semiconductor manufacturing using a radiation scattering technique such as raman spectroscopy
Grant 6,067,154 - Hossain , et al. May 23, 2 | 2000-05-23 |
Apparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photons
Grant 6,005,915 - Hossain , et al. December 21, 1 | 1999-12-21 |
Alternative process for BPTEOS/BPSG layer formation
Grant 5,913,131 - Hossain , et al. June 15, 1 | 1999-06-15 |
Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF)
Grant 5,778,039 - Hossain , et al. July 7, 1 | 1998-07-07 |
Apparatus and method for characterizing particles embedded within a thin film configured upon a semiconductor wafer
Grant 5,754,620 - Hossain , et al. May 19, 1 | 1998-05-19 |
Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer
Grant 5,742,658 - Tiffin , et al. April 21, 1 | 1998-04-21 |
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