Hosokawa; Fumio

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hosokawa; Fumio.The latest application filed is for "beam alignment method and electron microscope".

Company Profile

0.14.14

Hosokawa; Fumio - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Beam alignment method and electron microscope Grant 10,020,162 - Shimizu , et al. July 10, 2	2018-07-10
Beam Alignment Method and Electron Microscope App 20170301507 - Shimizu; Yuko ; et al.	2017-10-19
Chromatic aberration corrector and method of controlling same Grant 8,952,339 - Hosokawa February 10, 2	2015-02-10
Chromatic aberration corrector and electron microscope Grant 8,785,880 - Sawada , et al. July 22, 2	2014-07-22
Chromatic Aberration Corrector And Electron Microscope App 20140158901 - Sawada; Hidetaka ; et al.	2014-06-12
Electron microscope Grant 8,664,599 - Hosokawa March 4, 2	2014-03-04
Chromatic Aberration Corrector and Method of Controlling Same App 20140054468 - Hosokawa; Fumio	2014-02-27
Chromatic aberration corrector for charged-particle beam system and correction method therefor Grant 8,178,850 - Sawada , et al. May 15, 2	2012-05-15
Electron Microscope App 20100224781 - Hosokawa; Fumio	2010-09-09
Method of aberration correction and electron beam system Grant 7,763,862 - Hosokawa July 27, 2	2010-07-27
Chromatic Aberration Corrector for Charged-Particle Beam System and Correction Method Therefor App 20100084567 - Sawada; Hidetaka ; et al.	2010-04-08
Charged-particle beam system Grant 7,598,496 - Sawada , et al. October 6, 2	2009-10-06
Electron microscope Grant 7,420,179 - Hosokawa September 2, 2	2008-09-02
Charged-Particle Beam System App 20080128635 - SAWADA; Hidetaka ; et al.	2008-06-05
Aberration Corrector and Method of Aberration Correction App 20080093563 - Sawada; Hidetaka ; et al.	2008-04-24
Method of Aberration Correction and Electron Beam System App 20080054186 - Hosokawa; Fumio	2008-03-06
Electron microscope App 20070114403 - Hosokawa; Fumio	2007-05-24
Multipole field-producing apparatus in charged-particle optical system and aberration corrector Grant 7,060,985 - Hosokawa June 13, 2	2006-06-13
Multipole field-producing apparatus in charged-particle optical system and aberration corrector App 20050167607 - Hosokawa, Fumio	2005-08-04
Charged-particle beam apparatus equipped with aberration corrector Grant 6,924,488 - Matsuya , et al. August 2, 2	2005-08-02
Spherical aberration corrector for electron microscope Grant 6,836,373 - Hosokawa December 28, 2	2004-12-28
Lens system for phase plate for transmission electron microscope and transmission electron microscope Grant 6,744,048 - Hosokawa , et al. June 1, 2	2004-06-01
Charged-particle beam apparatus equipped with aberration corrector App 20040036030 - Matsuya, Miyuki ; et al.	2004-02-26
Transmission electron microscope Grant 6,555,818 - Hosokawa April 29, 2	2003-04-29
Spherical aberration corrector for electron microscope App 20030029999 - Hosokawa, Fumio	2003-02-13
Lens system for phase plate for transmission electron microscope and transmission electron microscope App 20020148962 - Hosokawa, Fumio ; et al.	2002-10-17
Stigmator assembly App 20020121609 - Hosokawa, Fumio	2002-09-05

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