Hoshino; Kozo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hoshino; Kozo.The latest application filed is for "solid-state imaging device and electronic apparatus".

Company Profile

1.7.7

Hoshino; Kozo - Tokyo JP
Hoshino; Kozo - Moka N/A JP
Hoshino; Kozo - Osaka N/A JP
Hoshino; Kozo - Tochigi JP
Hoshino; Kozo - Tenri JP
Hoshino, Kozo - Tenri-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Solid-state Imaging Device And Electronic Apparatus App 20220150451 - Hoshino; Kozo	2022-05-12
Solid-state imaging device and electronic apparatus Grant 11,258,993 - Hoshino February 22, 2	2022-02-22
Solid-state Imaging Device And Electronic Apparatus App 20220038663 - Hoshino; Kozo	2022-02-03
Solid-state Imaging Device And Electronic Apparatus App 20200358989 - Hoshino; Kozo	2020-11-12
Aluminum alloy for anodizing having durability, contamination resistance and productivity, method for producing the same, aluminum alloy member having anodic oxide coating, and plasma processing apparatus Grant 8,404,059 - Wada , et al. March 26, 2	2013-03-26
A/D converter circuit and solid-state imaging device having series-connected capacitative elements with plural input circuits Grant 8,354,630 - Hoshino January 15, 2	2013-01-15
A/D converter, solid-state image capturing apparatus and electronic information device Grant 8,130,125 - Hoshino March 6, 2	2012-03-06
A/d Converter Circuit And Solid-state Imaging Device App 20110001039 - Hoshino; Kozo	2011-01-06
A/D converter, solid-state image capturing apparatus and electronic information device App 20100315540 - Hoshino; Kozo	2010-12-16
Aluminum Alloy For Anodizing Having Durability, Contamination Resistance And Productivity, Method For Producing The Same, Aluminum Alloy Member Having Anodic Oxide Coating, And Plasma Processing Apparatus App 20100018617 - Wada; Koji ; et al.	2010-01-28
Method of evaluating characteristics of semiconductor memory element, and method of extracting model parameter of semiconductor memory element Grant 7,088,618 - Hoshino , et al. August 8, 2	2006-08-08
Method of evaluating characteristics of semiconductor memory element, and method of extracting model parameter of semiconductor memory element App 20050117419 - Hoshino, Kozo ; et al.	2005-06-02

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