Hoshino; Kazuhito
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hoshino; Kazuhito.The latest application filed is for "analyzing apparatus and analyzing method".
- Hoshino; Kazuhito - Saitama JP
- Hoshino, Kazuhito - Tokorozawa-shi JP
| Patent | Date |
|---|---|
| Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus Grant 7,400,705 - Hoshino , et al. July 15, 2 | 2008-07-15 |
| Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus Grant 6,993,113 - Hoshino , et al. January 31, 2 | 2006-01-31 |
| Analyzing apparatus and analyzing method Grant 6,937,695 - Hoshino August 30, 2 | 2005-08-30 |
| Analyzing apparatus and analyzing method App 20040066895 - Hoshino, Kazuhito | 2004-04-08 |
| Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus App 20040008816 - Hoshino, Kazuhito ; et al. | 2004-01-15 |
| Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus. App 20040008815 - Hoshino, Kazuhito ; et al. | 2004-01-15 |
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