Hosaka; Tadayoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hosaka; Tadayoshi.The latest application filed is for "wafer inspection system".

Company Profile

5.4.6

Hosaka; Tadayoshi - Nirasaki JP
Hosaka; Tadayoshi - Nirasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Wafer inspection system, wafer inspection apparatus and prober Grant 11,061,071 - Hagihara , et al. July 13, 2	2021-07-13
Wafer Inspection System App 20210190861 - Hagihara; Junichi ; et al.	2021-06-24
Test head and wafer inspection apparatus Grant 10,976,364 - Hagihara , et al. April 13, 2	2021-04-13
Wafer Inspection System, Wafer Inspection Apparatus And Prober App 20200400743 - Hagihara; Junichi ; et al.	2020-12-24
Test Head And Wafer Inspection Apparatus App 20200348358 - Hagihara; Junichi ; et al.	2020-11-05
Wafer inspection system, wafer inspection apparatus and prober Grant 10,753,972 - Hagihara , et al. A	2020-08-25
Wafer Inspection System, Wafer Inspection Apparatus And Prober App 20200064400 - Hagihara; Junichi ; et al.	2020-02-27
Wafer Inspection System, Wafer Inspection Apparatus And Prober App 20170234924 - Hagihara; Junichi ; et al.	2017-08-17
Maintenance carriage for wafer inspection apparatus and maintenance method for wafer inspection apparatus Grant 9,671,459 - Hagihara , et al. June 6, 2	2017-06-06
Maintenance Carriage For Wafer Inspection Apparatus And Maintenance Method For Wafer Inspection Apparatus App 20150115991 - Hagihara; Junichi ; et al.	2015-04-30

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