Horie; Masahiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Horie; Masahiro.The latest application filed is for "methods of inspecting substrates and semiconductor fabrication methods incorporating the same".

Company Profile

0.19.22

Horie; Masahiro - Suwon-si KR
HORIE; Masahiro - Tokyo JP
Horie; Masahiro - Kyoto JP
Horie; Masahiro - Kuga-gun JP
Horie; Masahiro - Yamaguchi JP
Horie; Masahiro - Hiroshima JP
Horie; Masahiro - Yamaguchi-ken JP
Horie; Masahiro - Kuga JP
Horie, Masahiro - Kuga-gin JP
Horie, Masahiro - Kamikyo-ku JP
Horie; Masahiro - Kamikyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Surface inspecting method Grant 10,001,444 - Ko , et al. June 19, 2	2018-06-19
Method for detecting overlay error and method for manufacturing semiconductor device using the same Grant 9,841,688 - Ko , et al. December 12, 2	2017-12-12
Methods Of Inspecting Substrates And Semiconductor Fabrication Methods Incorporating The Same App 20170200658 - Yang; Yusin ; et al.	2017-07-13
Method For Detecting Overlay Error And Method For Manufacturing Semiconductor Device Using The Same App 20160300767 - Ko; Kang-Woong ; et al.	2016-10-13
Surface Inspecting Method App 20160153915 - Ko; Kang-woong ; et al.	2016-06-02
Vehicle Discrimination Apparatus App 20160055382 - HORIE; Masahiro ; et al.	2016-02-25
Spectroscopic ellipsometer, film thickness measuring apparatus, and method of focusing in spectroscopic ellipsometer Grant 7,929,139 - Horie , et al. April 19, 2	2011-04-19
Measuring method and apparatus for measuring depth of trench pattern Grant 7,710,579 - Yamaguchi , et al. May 4, 2	2010-05-04
Recording/reproduction device and method Grant 7,711,249 - Kawasaki , et al. May 4, 2	2010-05-04
Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring method Grant 7,612,873 - Akashika , et al. November 3, 2	2009-11-03
Recording apparatus, OSD controlling method, program, and recording medium Grant 7,555,199 - Horie , et al. June 30, 2	2009-06-30
Viewer Device, Slide Show Display Method In Viewer Device, And Program App 20090119596 - Iwahara; Yuji ; et al.	2009-05-07
Spectroscopic Ellipsometer And Film Thickness Measuring Apparatus App 20090066953 - HORIE; Masahiro	2009-03-12
Spectroscopic Ellipsometer, Film Thickness Measuring Apparatus, And Method Of Focusing In Spectroscopic Ellipsometer App 20090059228 - Horie; Masahiro ; et al.	2009-03-05
Apparatus for Inspecting Defect and Method of Inspecting Defect App 20080243412 - Horie; Masahiro ; et al.	2008-10-02
Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring method App 20080111987 - Akashika; Kumiko ; et al.	2008-05-15
Measuring method and apparatus for measuring depth of trench pattern App 20080049222 - Yamaguchi; Shinji ; et al.	2008-02-28
Recording apparatus, recording program, and recording method Grant 7,254,318 - Imada , et al. August 7, 2	2007-08-07
Record and playback apparatus and record medium Grant 7,177,531 - Horie , et al. February 13, 2	2007-02-13
Spectroscopic ellipsometer Grant 7,095,498 - Horie August 22, 2	2006-08-22
Recording/reproduction device and method App 20060140219 - Kawasaki; Kojiro ; et al.	2006-06-29
Apparatus for measuring film thickness formed on object, apparatus and method of measuring spectral reflectance of object, and apparatus and method of inspecting foreign material on object Grant 6,937,333 - Horie , et al. August 30, 2	2005-08-30
System and method for object identification App 20050178947 - Sasaki, Kouji ; et al.	2005-08-18
Printer driver, printer, and recording medium on which printer driver program is recorded Grant 6,879,408 - Hori , et al. April 12, 2	2005-04-12
Method of measuring dielectric constant using light in a plurality of wavelength ranges Grant 6,862,095 - Horie March 1, 2	2005-03-01
Film forming apparatus and film forming method App 20050006560 - Horie, Masahiro ; et al.	2005-01-13
Spectroscopic ellipsometer App 20040233437 - Horie, Masahiro	2004-11-25
Recording apparatus, OSD controlling method, program, and recording medium App 20040156620 - Horie, Masahiro ; et al.	2004-08-12
Apparatus for measuring film thickness formed on object, apparatus and method of measuring spectral reflectance of object, and apparatus and method of inspecting foreign material on object App 20040075836 - Horie, Masahiro ; et al.	2004-04-22
Recording apparatus and computer-readable program App 20040047595 - Matsuura, Yasuyuki ; et al.	2004-03-11
Recording apparatus, recording program, and recording method App 20030099460 - Imada, Masayuki ; et al.	2003-05-29
Method of measuring dielectric constant using light in a plurality of wavelength ranges App 20030067603 - Horie, Masahiro	2003-04-10
Surface inspection of object using image processing App 20030059103 - Shiomi, Junichi ; et al.	2003-03-27
Record and playback apparatus and record medium App 20020094191 - Horie, Masahiro ; et al.	2002-07-18
Method of and apparatus for inspecting residue of metal film Grant 6,020,968 - Horie February 1, 2	2000-02-01
Method of and apparatus for measuring film thickness Grant 5,686,993 - Kokubo , et al. November 11, 1	1997-11-11
Method of measuring film thicknesses Grant 5,493,401 - Horie , et al. February 20, 1	1996-02-20
Method of measuring a thickness of a multilayered sample using ultraviolet light and light with wavelengths longer than ultraviolet Grant 5,440,141 - Horie August 8, 1	1995-08-08
Method of focusing optical head on object body and automatic focusing device for optical inspection system including tilt detection Grant 5,136,149 - Fujiwara , et al. August 4, 1	1992-08-04