| Patent | Date |
|---|
Semiconductor device for detecting characteristics of semiconductor element and operating method thereof
Grant 11,327,112 - Hong May 10, 2 | 2022-05-10 |
Semiconductor Device For Detecting Characteristics Of Semiconductor Element And Operating Method Thereof
App 20220057447 - HONG; Yun Seok | 2022-02-24 |
Devices configured to conduct a power gating operation
Grant 11,188,109 - Hong November 30, 2 | 2021-11-30 |
Semiconductor system including a phase changeable memory device
Grant 11,049,558 - Hong June 29, 2 | 2021-06-29 |
Semiconductor System Including A Phase Changeable Memory Device
App 20200185029 - HONG; Yun Seok | 2020-06-11 |
Semiconductor system including a phase changeable memory device
Grant 10,607,697 - Hong | 2020-03-31 |
Data transfer device and semiconductor device including the data transfer device
Grant 10,607,666 - Hong | 2020-03-31 |
Data Transfer Device And Semiconductor Device Including The Data Transfer Device
App 20190295612 - HONG; Yun Seok | 2019-09-26 |
Semiconductor integrated circuit device having electrostatic discharge protection circuit
Grant 10,388,561 - Hong A | 2019-08-20 |
Semiconductor integrated circuit device relating to an electrical over stress protecting circuit
Grant 10,141,298 - Hong Nov | 2018-11-27 |
Voltage Controlling Circuit
App 20180082739 - HONG; Yun Seok | 2018-03-22 |
Voltage controlling circuit
Grant 9,922,708 - Hong March 20, 2 | 2018-03-20 |
Semiconductor System Including A Phase Changeable Memory Device
App 20180061491 - HONG; Yun Seok | 2018-03-01 |
Semiconductor Integrated Circuit Device Having Electrostatic Discharge Protection Circuit
App 20180025934 - HONG; Yun Seok | 2018-01-25 |
Semiconductor Integrated Circuit Device Relating To An Electrical Over Stress Protecting Circuit
App 20180026026 - HONG; Yun Seok | 2018-01-25 |
Substate bias voltage generation circuits and methods to control leakage in semiconductor memory device
Grant 9,577,636 - Hong February 21, 2 | 2017-02-21 |
Semiconductor device and semiconductor system including the same
Grant 9,568,934 - Hong February 14, 2 | 2017-02-14 |
Semiconductor memory device including array e-fuse
Grant 9,557,788 - Hong January 31, 2 | 2017-01-31 |
Internal voltage generation circuits
Grant 9,543,827 - Hong January 10, 2 | 2017-01-10 |
Pumping circuit
Grant 9,502,966 - Lee , et al. November 22, 2 | 2016-11-22 |
Semiconductor Device And Semiconductor System Including The Same
App 20160334827 - HONG; Yun Seok | 2016-11-17 |
Semiconductor device having fuse array with disconnectable voltage generator and method of operating the same
Grant 9,466,391 - Hong October 11, 2 | 2016-10-11 |
Boot-up method of E-fuse, semiconductor device and semiconductor system including the same
Grant 9,430,247 - Hong August 30, 2 | 2016-08-30 |
Driver circuit of semiconductor apparatus
Grant 9,430,032 - Hong August 30, 2 | 2016-08-30 |
Internal Voltage Generation Circuits
App 20160149485 - HONG; Yun Seok | 2016-05-26 |
Power control device
Grant 9,236,859 - Hong January 12, 2 | 2016-01-12 |
Semiconductor Device Having Fuse Array And Method Of Operating The Same
App 20150194221 - HONG; Yun-Seok | 2015-07-09 |
Driver Circuit Of Semiconductor Apparatus
App 20150046722 - HONG; Yun Seok | 2015-02-12 |
Protection Circuit And Protection Apparatus Including The Same
App 20150029624 - HONG; Yun Seok ; et al. | 2015-01-29 |
Boot-up Method Of E-fuse, Semiconductor Device And Semiconductor System Including The Same
App 20150019853 - HONG; Yun-Seok | 2015-01-15 |
Semiconductor Device
App 20150006926 - HONG; Yun-Seok | 2015-01-01 |
Driving Device
App 20140368237 - HONG; Yun Seok | 2014-12-18 |
Pumping Circuit
App 20140369095 - LEE; Myung Hwan ; et al. | 2014-12-18 |
Driving device
Grant 8,896,354 - Hong November 25, 2 | 2014-11-25 |
Initialization Circuit
App 20140145766 - LEE; Myung Hwan ; et al. | 2014-05-29 |
Power-up signal generation circuit of semiconductor apparatus
Grant 8,547,145 - Hong October 1, 2 | 2013-10-01 |
Internal Voltage Generation Circuit
App 20130169354 - HONG; Yun Seok | 2013-07-04 |
Self refresh circuit
Grant 8,441,864 - Hong May 14, 2 | 2013-05-14 |
Test device for testing transistor characteristics in semiconductor integrated circuit
Grant 8,432,179 - Hong April 30, 2 | 2013-04-30 |
Power-up Signal Generation Circuit Of Semiconductor Apparatus
App 20120249228 - HONG; Yun Seok | 2012-10-04 |
Digital temperature information generating apparatus for semiconductor integrated circuit
Grant 8,220,992 - Hong July 17, 2 | 2012-07-17 |
Self Refresh Circuit
App 20110242913 - HONG; Yun Seok | 2011-10-06 |
Delay circuit
Grant 8,026,752 - Hong September 27, 2 | 2011-09-27 |
Test Device For Testing Transistor Characteristics In Semiconductor Integrated Circuit
App 20110025366 - HONG; Yun Seok | 2011-02-03 |
Refresh period signal generator with digital temperature information generation function
Grant 7,859,931 - Hong , et al. December 28, 2 | 2010-12-28 |
Semiconductor memory apparatus having decreased leakage current
Grant 7,835,216 - Hong November 16, 2 | 2010-11-16 |
Delay Circuit
App 20100156490 - HONG; Yun Seok | 2010-06-24 |
Semiconductor Memory Apparatus Having Decreased Leakage Current
App 20100118638 - HONG; Yun Seok | 2010-05-13 |
Period signal generator of semiconductor integrated circuit
Grant 7,705,688 - Hong April 27, 2 | 2010-04-27 |
Refresh Period Signal Generator With Digital Temperature Information Generation Function
App 20090154279 - Hong; Yun-Seok ; et al. | 2009-06-18 |
Digital Temperature Information Generating Apparatus For Semiconductor Integrated Circuit
App 20090129439 - Hong; Yun-Seok | 2009-05-21 |
Period Signal Generator Of Semiconductor Integreated Circuit
App 20090058539 - Hong; Yun Seok | 2009-03-05 |
Temperature compensated self-refresh circuit
Grant 7,471,136 - Hong December 30, 2 | 2008-12-30 |
Method for analyzing defect of SRAM cell
Grant 7,313,039 - Hong December 25, 2 | 2007-12-25 |
Low power semiconductor memory device
Grant 7,193,925 - Hong March 20, 2 | 2007-03-20 |
Device for controlling temperature compensated self-refresh period
Grant 7,145,826 - Hong , et al. December 5, 2 | 2006-12-05 |
Method for analyzing defect of SRAM cell
App 20060256632 - Hong; Yun Seok | 2006-11-16 |
Memory device including parallel test circuit
Grant 7,126,865 - Hong , et al. October 24, 2 | 2006-10-24 |
Method for analyzing defect of SRAM cell
Grant 7,095,663 - Hong August 22, 2 | 2006-08-22 |
Device for controlling temperature compensated self-refresh period
App 20060087901 - Hong; Yun Seok ; et al. | 2006-04-27 |
Temperature compensated self-refresh circuit
App 20060066386 - Hong; Yun Seok | 2006-03-30 |
Memory device including parallel test circuit
App 20050195666 - Hong, Yun Seok ; et al. | 2005-09-08 |
Low power semiconductor memory device
App 20050146972 - Hong, Yun Seok | 2005-07-07 |
Method for analyzing defect of SRAM cell
App 20050111272 - Hong, Yun Seok | 2005-05-26 |
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