Hong; Seungok

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hong; Seungok.The latest application filed is for "device and method for internal flaw magnification or removal during wire drawing".

Company Profile

0.5.7

Hong; Seungok - New Providence NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Device And Method For Internal Flaw Magnification Or Removal During Wire Drawing App 20160178495 - Parrell; Jeff ; et al.	2016-06-23
Device for internal flaw magnification during wire drawing Grant 8,943,681 - Parrell , et al. February 3, 2	2015-02-03
Wire-in-channel superconductor Grant 8,319,105 - Thomas , et al. November 27, 2	2012-11-27
Device And Method For Internal Flaw Magnification Or Removal App 20100101076 - Parrell; Jeff ; et al.	2010-04-29
Critical current density in Nb.sub.3Sn superconducting wire Grant 7,585,377 - Field , et al. September 8, 2	2009-09-08
Wire-in-channel Superconductor App 20090194316 - Thomas; Adrian Mark ; et al.	2009-08-06
Critical current density in Nb3Sn superconducting wire App 20080274903 - Field; Michael ; et al.	2008-11-06
Critical current density in Nb.sub.3Sn superconducting wire Grant 7,368,021 - Field , et al. May 6, 2	2008-05-06
Method of heat treating HTc conductors in a large fabricated system App 20060089264 - Hong; Seungok	2006-04-27
Critical current density in Nb3Sn superconducting wire App 20060081307 - Field; Michael ; et al.	2006-04-20

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.