loadpatents
name:-0.028256893157959
name:-0.025178909301758
name:-0.0055999755859375
Hong; Min Hao Patent Filings

Hong; Min Hao

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hong; Min Hao.The latest application filed is for "method of using a polishing system".

Company Profile
5.32.31
  • Hong; Min Hao - Kaohsiung TW
  • HONG; Min Hao - Kaohsiung City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of using a polishing system
Grant 11,358,252 - Lin , et al. June 14, 2
2022-06-14
Apparatus and method for processing wafer
Grant 10,861,721 - Chou , et al. December 8, 2
2020-12-08
Method Of Using A Polishing System
App 20190337116 - LIN; Shih-Chi ;   et al.
2019-11-07
Polishing system
Grant 10,357,867 - Lin , et al. July 23, 2
2019-07-23
Apparatus And Method For Processing Wafer
App 20190172735 - CHOU; You-Hua ;   et al.
2019-06-06
Apparatus and method for processing wafer
Grant 10,204,807 - Chou , et al. Feb
2019-02-12
Apparatus And Method For Processing Wafer
App 20180308724 - CHOU; You-Hua ;   et al.
2018-10-25
Polishing System
App 20170312881 - LIN; Shih-Chi ;   et al.
2017-11-02
Image sensor isolation region and method of forming the same
Grant 9,786,707 - JangJian , et al. October 10, 2
2017-10-10
Polishing system and polishing method
Grant 9,718,164 - Lin , et al. August 1, 2
2017-08-01
Image sensor isolation region and method of forming the same
Grant 9,673,244 - JangJian , et al. June 6, 2
2017-06-06
Reverse damascene process
Grant 9,607,946 - Chou , et al. March 28, 2
2017-03-28
Reverse damascene process
Grant 9,536,834 - Chou , et al. January 3, 2
2017-01-03
Two-step shallow trench isolation (STI) process
Grant 9,502,280 - Hong , et al. November 22, 2
2016-11-22
Grids in backside illumination image sensor chips and methods for forming the same
Grant 9,478,581 - JangJian , et al. October 25, 2
2016-10-25
CIS image sensors with epitaxy layers and methods for forming the same
Grant 9,368,540 - JangJian , et al. June 14, 2
2016-06-14
Grids in Backside Illumination Image Sensor Chips and Methods for Forming the Same
App 20160155771 - JangJian; Shiu-Ko ;   et al.
2016-06-02
System and method for reducing irregularities on the surface of a backside illuminated photodiode
Grant 9,349,902 - JangJian , et al. May 24, 2
2016-05-24
Grids in backside illumination image sensor chips and methods for forming the same
Grant 9,257,476 - JangJian , et al. February 9, 2
2016-02-09
Mechanisms for forming semiconductor device having stable dislocation profile
Grant 9,214,514 - Hong , et al. December 15, 2
2015-12-15
Grids in Backside Illumination Image Sensor Chips and Methods for Forming the Same
App 20150236067 - JangJian; Shiu-Ko ;   et al.
2015-08-20
Two-Step Shallow Trench Isolation (STI) Process
App 20150179502 - Hong; Min Hao ;   et al.
2015-06-25
Grids in backside illumination image sensor chips and methods for forming the same
Grant 9,041,140 - JangJian , et al. May 26, 2
2015-05-26
Mechanisms For Forming Semiconductor Device Having Stable Dislocation Profile
App 20150132913 - HONG; Min-Hao ;   et al.
2015-05-14
Two-step shallow trench isolation (STI) process
Grant 9,006,070 - Hong , et al. April 14, 2
2015-04-14
CIS Image Sensors with Epitaxy Layers and Methods for Forming the Same
App 20150041851 - JangJian; Shiu-Ko ;   et al.
2015-02-12
CIS image sensors with epitaxy layers and methods for forming the same
Grant 8,889,461 - JangJian , et al. November 18, 2
2014-11-18
Method and apparatus for preparing polysilazane on a semiconductor wafer
Grant 8,796,105 - Chou , et al. August 5, 2
2014-08-05
Method and apparatus for backside illumination sensor
Grant 8,772,899 - JangJian , et al. July 8, 2
2014-07-08
Two-step Shallow Trench Isolation (sti) Process
App 20140179071 - Hong; Min Hao ;   et al.
2014-06-26
Polishing System And Polishing Method
App 20140162534 - LIN; Shih-Chi ;   et al.
2014-06-12
Two-step shallow trench isolation (STI) process
Grant 8,692,299 - Hong , et al. April 8, 2
2014-04-08
Two-step Shallow Trench Isolation (sti) Process
App 20140054653 - Hong; Min Hao ;   et al.
2014-02-27
Method And Apparatus For Preparing Polysilazane On A Semiconductor Wafer
App 20140030866 - Chou; You-Hua ;   et al.
2014-01-30
Reverse Damascene Process
App 20130328198 - Chou; You-Hua ;   et al.
2013-12-12
CIS Image Sensors with Epitaxy Layers and Methods for Forming the Same
App 20130320419 - JangJian; Shiu-Ko ;   et al.
2013-12-05
System and Method for Processing a Backside Illuminated Photodiode
App 20130320478 - JangJian; Shiu-Ko ;   et al.
2013-12-05
Image Sensor Isolation Region and Method of Forming the Same
App 20130280849 - JangJian; Shiu-Ko ;   et al.
2013-10-24
Reverse Damascene Process
App 20130260552 - Chou; You-Hua ;   et al.
2013-10-03
Grids in Backside Illumination Image Sensor Chips and Methods for Forming the Same
App 20130241018 - JangJian; Shiu-Ko ;   et al.
2013-09-19
Image Sensor Isolation Region and Method of Forming the Same
App 20130234202 - JangJian; Shiu-Ko ;   et al.
2013-09-12
Method and Apparatus for Backside Illumination Sensor
App 20130228886 - JangJian; Shiu-Ko ;   et al.
2013-09-05
Reverse damascene process
Grant 8,518,818 - Chou , et al. August 27, 2
2013-08-27
Stressed semiconductor device and method of manufacturing
Grant 8,455,883 - Liao , et al. June 4, 2
2013-06-04
Reverse Damascene Process
App 20130069233 - Chou; You-Hua ;   et al.
2013-03-21
Stressed Semiconductor Device And Method Of Manufacturing
App 20120292639 - Liao; Miao-Cheng ;   et al.
2012-11-22

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed