loadpatents
name:-0.013329982757568
name:-0.013715028762817
name:-0.00057005882263184
Hong; Hyesook Patent Filings

Hong; Hyesook

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hong; Hyesook.The latest application filed is for "method and device employing polysilicon scaling".

Company Profile
0.9.10
  • Hong; Hyesook - Allen TX
  • Hong; Hyesook - Richardson TX
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method and device employing polysilicon scaling
Grant 8,637,918 - Fang , et al. January 28, 2
2014-01-28
Monitor for variation of critical dimensions (CDs) of reticles
Grant 8,198,105 - Hong , et al. June 12, 2
2012-06-12
Method And Device Employing Polysilicon Scaling
App 20120056260 - Fang; Shenqing ;   et al.
2012-03-08
Method and device employing polysilicon scaling
Grant 8,076,199 - Fang , et al. December 13, 2
2011-12-13
Method And Device Employing Polysilicon Scaling
App 20100207191 - FANG; Shenqing ;   et al.
2010-08-19
Integration Method For Dual Doped Polysilicon Gate Profile And Cd Control
App 20090104745 - Hong; Hyesook ;   et al.
2009-04-23
Plasma Dry Etch Process For Metal-containing Gates
App 20080242072 - Choi; Jinhan ;   et al.
2008-10-02
Plasma treatment for silicon-based dielectrics
Grant 7,282,436 - Jiang , et al. October 16, 2
2007-10-16
Method to obtain fully silicided gate electrodes
Grant 7,244,642 - Vitale , et al. July 17, 2
2007-07-17
Method to obtain fully silicided gate electrodes
App 20070066007 - Vitale; Steven A. ;   et al.
2007-03-22
Dual cap layer in damascene interconnection processes
Grant 7,129,162 - Hong , et al. October 31, 2
2006-10-31
Plasma treatment for silicon-based dielectrics
App 20050255687 - Jiang, Ping ;   et al.
2005-11-17
Monitor for variation of critical dimensions (CDs) of reticles
App 20050164096 - Hong, Hyesook ;   et al.
2005-07-28
Plasma treatment of low-k dielectric films to improve patterning
Grant 6,620,560 - Jiang , et al. September 16, 2
2003-09-16
Treatment of low-k dielectric films to enable patterning of deep submicron features
Grant 6,605,536 - Eissa , et al. August 12, 2
2003-08-12
Treatment of low-k dielectric films to enable patterning of deep submicron features
App 20020127876 - Eissa, Mona ;   et al.
2002-09-12
Plasma treatment of low-k dielectric films to improve patterning
App 20020090822 - Jiang, Ping ;   et al.
2002-07-11
Treatment of low-k dielectric films to enable patterning of deep submicron features
App 20020064951 - Eissa, Mona M. ;   et al.
2002-05-30

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