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name:-0.013323068618774
name:-0.011400938034058
name:-0.0069231986999512
Honda; Tomonori Patent Filings

Honda; Tomonori

Patent Applications and Registrations

Patent applications and USPTO patent grants for Honda; Tomonori.The latest application filed is for "sequenced approach for determining wafer path quality".

Company Profile
7.8.13
  • Honda; Tomonori - Santa Clara CA
  • Honda; Tomonori - Redwood City CA
  • Honda; Tomonori - Aichi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Maintenance scheduling for semiconductor manufacturing equipment
Grant 11,295,993 - Honda , et al. April 5, 2
2022-04-05
Sequenced Approach For Determining Wafer Path Quality
App 20220066410 - Honda; Tomonori ;   et al.
2022-03-03
Wafer Bin Map Based Root Cause Analysis
App 20210342993 - Honda; Tomonori ;   et al.
2021-11-04
Abnormal Wafer Image Classification
App 20210334608 - Honda; Tomonori ;   et al.
2021-10-28
Rational Decision-Making Tool for Semiconductor Processes
App 20210294950 - Honda; Tomonori ;   et al.
2021-09-23
Generating robust machine learning predictions for semiconductor manufacturing processes
Grant 11,029,673 - Honda , et al. June 8, 2
2021-06-08
Failure detection and classsification using sensor data and/or measurement data
Grant 11,029,359 - Honda , et al. June 8, 2
2021-06-08
Semiconductor yield prediction
Grant 11,022,642 - David , et al. June 1, 2
2021-06-01
Collaborative Learning Model for Semiconductor Applications
App 20210142122 - Honda; Tomonori ;   et al.
2021-05-13
Machine Learning Variable Selection And Root Cause Discovery By Cumulative Prediction
App 20210117861 - Burch; Richard ;   et al.
2021-04-22
Anomalous Equipment Trace Detection and Classification
App 20210103489 - Burch; Richard ;   et al.
2021-04-08
Maintenance Scheduling For Semiconductor Manufacturing Equipment
App 20200388545 - Honda; Tomonori ;   et al.
2020-12-10
Selective inclusion/exclusion of semiconductor chips in accelerated failure tests
Grant 10,777,470 - Cheong , et al. Sept
2020-09-15
Method for Modelica-based system fault analysis at the design stage
Grant 10,558,766 - Saha , et al. Feb
2020-02-11
Selective Inclusion/exclusion Of Semiconductor Chips In Accelerated Failure Tests
App 20190304849 - Cheong; Lin Lee ;   et al.
2019-10-03
Generating Robust Machine Learning Predictions For Semiconductor Manufacturing Processes
App 20180356807 - Honda; Tomonori ;   et al.
2018-12-13
Device health estimation by combining contextual information with sensor data
Grant 10,078,062 - Eldardiry , et al. September 18, 2
2018-09-18
Method For Modelica-based System Fault Analysis At The Design Stage
App 20170193143 - Saha; Bhaskar ;   et al.
2017-07-06
Device Health Estimation By Combining Contextual Information With Sensor Data
App 20170167993 - Eldardiry; Hoda M. A. ;   et al.
2017-06-15
Method of jointing porous building plates
Grant 5,368,665 - Koyama , et al. November 29, 1
1994-11-29

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