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Hombourger; Chrystel Patent Filings

Hombourger; Chrystel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hombourger; Chrystel.The latest application filed is for "device for measuring the emission of x rays produced by an object exposed to an electron beam".

Company Profile
0.1.1
  • Hombourger; Chrystel - Paris FR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Device for measuring the emission of X-rays produced by an object exposed to an electron beam
Grant 7,049,588 - De Chambost , et al. May 23, 2
2006-05-23
Device for measuring the emission of x rays produced by an object exposed to an electron beam
App 20050211898 - De Chambost, Emmanuel ;   et al.
2005-09-29

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