loadpatents
name:-0.0039291381835938
name:-0.0066728591918945
name:-0.00058317184448242
Holzapfel; Paul Patent Filings

Holzapfel; Paul

Patent Applications and Registrations

Patent applications and USPTO patent grants for Holzapfel; Paul.The latest application filed is for "multiprobe detection system for chemical-mechanical planarization tool".

Company Profile
0.8.2
  • Holzapfel; Paul - Mercer PA
  • Holzapfel; Paul - Chandler AZ
  • HOLZAPFEL, PAUL - TEMPE AZ
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Multiprobe detection system for chemical-mechanical planarization tool
Grant 6,960,115 - Weldon , et al. November 1, 2
2005-11-01
Multiprobe detection system for chemical-mechanical planarization tool
Grant 6,805,613 - Weldon , et al. October 19, 2
2004-10-19
Multiprobe detection system for chemical-mechanical planarization tool
App 20040038624 - Weldon, Matthew ;   et al.
2004-02-26
Polishing pad conditioning device with cutting elements
Grant 6,371,838 - Holzapfel April 16, 2
2002-04-16
Method and apparatus for conditioning polishing pads utilizing brazed diamond technology and titanium nitride
Grant 6,347,981 - Holzapfel February 19, 2
2002-02-19
Methods And Apparatus For The In-process Measurement Of Thin Film Layers
App 20010012108 - HOLZAPFEL, PAUL ;   et al.
2001-08-09
Apparatus for cleaning workpiece surfaces and monitoring probes during workpiece processing
Grant 6,217,410 - Holzapfel , et al. April 17, 2
2001-04-17
Methods and apparatus for detecting removal of thin film layers during planarization
Grant 5,872,633 - Holzapfel , et al. February 16, 1
1999-02-16
Apparatus for the in-process detection of workpieces with a monochromatic light source
Grant 5,823,853 - Bartels , et al. October 20, 1
1998-10-20
Apparatus for the in-process detection of workpieces in a CMP environment
Grant 5,733,171 - Allen , et al. March 31, 1
1998-03-31

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