loadpatents
Patent applications and USPTO patent grants for HOLLOWAY, THOMAS C..The latest application filed is for "lightly doped drain extension process to minimize source/drain resistance while maintaining hot carrier lifetime".
Patent | Date |
---|---|
Lightly Doped Drain Extension Process To Minimize Source/drain Resistance While Maintaining Hot Carrier Lifetime App 20010003666 - HOLLOWAY, THOMAS C. | 2001-06-14 |
Variable threshold voltage gate electrode for higher performance mosfets Grant 6,222,251 - Holloway April 24, 2 | 2001-04-24 |
Memory circuit and method of construction Grant 6,072,715 - Holloway June 6, 2 | 2000-06-06 |
Method of improving diffusion barrier properties of gate oxides by applying ions or free radicals of nitrogen in low energy Grant 6,040,249 - Holloway March 21, 2 | 2000-03-21 |
Semiconductor device having dual gate and method of formation Grant 5,989,962 - Holloway , et al. November 23, 1 | 1999-11-23 |
VLSI interconnect method and structure Grant 5,302,539 - Haken , et al. * April 12, 1 | 1994-04-12 |
Integrated circuit process with TiN-gate transistor Grant 4,931,411 - Tigelaar , et al. June 5, 1 | 1990-06-05 |
Single-polysilicon dram device and process Grant 4,894,693 - Tigelaar , et al. January 16, 1 | 1990-01-16 |
Threshold adjustment method for an IGFET Grant 4,845,047 - Holloway , et al. July 4, 1 | 1989-07-04 |
VLSI local interconnect structure Grant 4,821,085 - Haken , et al. April 11, 1 | 1989-04-11 |
Integrated circuit device and process with tin-gate transistor Grant 4,814,854 - Tigelaar , et al. March 21, 1 | 1989-03-21 |
Device and process with doubled capacitors Grant 4,811,076 - Tigelaar , et al. March 7, 1 | 1989-03-07 |
Integrated circuit device and process with tin capacitors Grant 4,811,078 - Tigelaar , et al. March 7, 1 | 1989-03-07 |
Process for making integrated circuits having titanium nitride triple interconnect Grant 4,804,636 - Groover, III , et al. February 14, 1 | 1989-02-14 |
Local interconnect Grant 4,746,219 - Holloway , et al. May 24, 1 | 1988-05-24 |
Oxide-capped titanium silicide formation Grant 4,690,730 - Tang , et al. September 1, 1 | 1987-09-01 |
Process to increase tin thickness Grant 4,676,866 - Tang , et al. June 30, 1 | 1987-06-30 |
Process for patterning local interconnects Grant 4,657,628 - Holloway , et al. April 14, 1 | 1987-04-14 |
Formation of submicron substrate element Grant 4,354,896 - Hunter , et al. October 19, 1 | 1982-10-19 |
Fabrication methods for the high capacity ram cell Grant 4,112,575 - Fu , et al. September 12, 1 | 1978-09-12 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.