Hofsass; Markus

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hofsass; Markus.The latest application filed is for "method for searching for potential faults in a layout of an integrated circuit".

Company Profile

0.4.4

Hofsass; Markus - Munchen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for searching for potential faults in a layout of an integrated circuit Grant 7,484,189 - Hofsass , et al. January 27, 2	2009-01-27
Set of masks including a first mask and a second trimming mask with a semitransparent region having a transparency between 20% and 80% to control diffraction effects and obtain maximum depth of focus for the projection of structure patterns onto a semiconductor wafer Grant 7,393,614 - Kohle , et al. July 1, 2	2008-07-01
Method for searching for potential faults in a layout of an integrated circuit App 20070044050 - Hofsass; Markus ; et al.	2007-02-22
Set of masks for the projection of structure patterns onto a semiconductor wafer App 20040197677 - Kohle, Roderick ; et al.	2004-10-07
Method for determining and removing phase conflicts on alternating phase masks Grant 6,730,463 - Heissmeier , et al. May 4, 2	2004-05-04
Alternating phase mask Grant 6,680,151 - Heissmeier , et al. January 20, 2	2004-01-20
Alternating phase mask App 20020192574 - Heissmeier, Michael ; et al.	2002-12-19
Method for determining and removing phase conflicts on alternating phase masks App 20020155362 - Heissmeier, Michael ; et al.	2002-10-24

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.