Hof; Albrecht

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hof; Albrecht.The latest application filed is for "apparatus and method for bearing a lithography mask".

Company Profile

0.16.9

Hof; Albrecht - Aalen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus and method for bearing a lithography mask Grant 9,964,862 - Hof May 8, 2	2018-05-08
Apparatus And Method For Bearing A Lithography Mask App 20170153555 - Hof; Albrecht	2017-06-01
Method Of Measuring A Shape Of An Optical Surface Based On Computationally Combined Surface Region Measurements And Interferometric Measuring Device App 20140078513 - FREIMANN; Rolf ; et al.	2014-03-20
Optical system, in particular in a microlithographic projection exposure apparatus Grant 8,654,345 - Hof , et al. February 18, 2	2014-02-18
Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring device Grant 8,593,642 - Freimann , et al. November 26, 2	2013-11-26
Method Of Measuring A Shape Of An Optical Surface And Interferometric Measuring Device App 20120229814 - FREIMANN; Rolf ; et al.	2012-09-13
Device and method for measuring lithography masks Grant 8,253,947 - Hof , et al. August 28, 2	2012-08-28
Optical System, In Particular In A Microlithographic Projection Exposure Apparatus App 20120140241 - Hof; Albrecht ; et al.	2012-06-07
Device And Method For Measuring Lithography Masks App 20110205549 - Hof; Albrecht ; et al.	2011-08-25
Apparatus And Method For Measuring The Positions Of Marks On A Mask App 20100153059 - Klose; Gerd ; et al.	2010-06-17
Device for sealing a projection exposure apparatus Grant 7,130,017 - Hof , et al. October 31, 2	2006-10-31
Device for sealing a projection exposure apparatus App 20050206860 - Hof, Albrecht ; et al.	2005-09-22
Optical system with isolated measuring structure Grant 6,864,988 - Hof , et al. March 8, 2	2005-03-08
Lithographic apparatus and device manufacturing method Grant 6,750,949 - Loopstra , et al. June 15, 2	2004-06-15
Lithographic apparatus and device manufacturing method App 20030058422 - Loopstra, Erik Roelof ; et al.	2003-03-27
Process for manufacturing optical surfaces and shaping machine for carrying out this process Grant 6,523,443 - Hof , et al. February 25, 2	2003-02-25
Optical system with a plurality of optical elements App 20030010902 - Hof, Albrecht ; et al.	2003-01-16
Spectacle lens with spherical front side and multifocal back side and process for its production Grant 6,089,713 - Hof , et al. July 18, 2	2000-07-18
Process and apparatus for the measurement of object topographies by means of projected fringe patterns Grant 5,379,107 - Hanssen , et al. January 3, 1	1995-01-03
Method for analyzing periodic brightness patterns Grant 5,343,294 - Kuchel , et al. August 30, 1	1994-08-30
Method and apparatus for three-dimensional optical measurement of object surfaces Grant 5,307,151 - Hof , et al. April 26, 1	1994-04-26
Method and apparatus for non-contact measuring of object surfaces Grant 5,135,309 - Kuchel , et al. August 4, 1	1992-08-04
Coordinate measuring apparatus having an optical sensing head Grant 4,963,728 - Hof , et al. October 16, 1	1990-10-16

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.