loadpatents
name:-0.0065779685974121
name:-0.0066721439361572
name:-0.0022261142730713
Ho; Yen-Hsung Patent Filings

Ho; Yen-Hsung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ho; Yen-Hsung.The latest application filed is for "method of testing wafer".

Company Profile
2.7.7
  • Ho; Yen-Hsung - Taoyuan County TW
  • Ho; Yen-Hsung - Zhongli TW
  • Ho; Yen-Hsung - Zhongli City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of testing wafer
Grant 11,430,733 - Ho , et al. August 30, 2
2022-08-30
Method Of Testing Wafer
App 20210043566 - HO; Yen-Hsung ;   et al.
2021-02-11
Semiconductor structure, testing and fabricating methods thereof
Grant 10,818,595 - Ho , et al. October 27, 2
2020-10-27
Semiconductor structure, testing and fabricating method thereof
Grant 10,037,927 - Ho , et al. July 31, 2
2018-07-31
Semiconductor Structure, Testing And Fabricating Methods Thereof
App 20180151458 - Ho; Yen-Hsung ;   et al.
2018-05-31
Semiconductor Structure, Testing And Fabricating Method Thereof
App 20180151459 - HO; Yen-Hsung ;   et al.
2018-05-31
Stress release layout and associated methods and devices
Grant 9,478,578 - Jeng , et al. October 25, 2
2016-10-25
Stress Release Layout and Associated Methods and Devices
App 20160043129 - Jeng; Chi-Cherng ;   et al.
2016-02-11
Stress release layout and associated methods and devices
Grant 9,196,642 - Tsai , et al. November 24, 2
2015-11-24
Stress Release Layout and Associated Methods and Devices
App 20140070352 - Tsai; Tsung-Han ;   et al.
2014-03-13
Implanting method for forming photodiode
Grant 8,652,868 - Shih , et al. February 18, 2
2014-02-18
Implanting Method for Forming Photodiode
App 20130230941 - Shih; Yu-Shen ;   et al.
2013-09-05

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