Ho; Lawrence Wai Cheung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ho; Lawrence Wai Cheung.The latest application filed is for "system and method for verifying and analyzing memory for high performance computing systems".

Company Profile

0.9.8

Ho; Lawrence Wai Cheung - Mississauga CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System And Method For Verifying And Analyzing Memory For High Performance Computing Systems App 20220148673 - Lai; Bosco Chun Sang ; et al.	2022-05-12
Systems and methods for testing and assembling memory modules Grant 9,224,500 - Ho , et al. December 29, 2	2015-12-29
Determining data valid windows in a system and method for testing an integrated circuit device Grant 8,918,686 - Lai , et al. December 23, 2	2014-12-23
Systems And Methods For Testing And Assembling Memory Modules App 20140211580 - Ho; Lawrence Wai Cheung ; et al.	2014-07-31
Systems and methods for testing and assembling memory modules Grant 8,724,408 - Ho , et al. May 13, 2	2014-05-13
Systems And Methods For Testing And Assembling Memory Modules App 20130135951 - HO; Lawrence Wai Cheung ; et al.	2013-05-30
Testing apparatus and method for analyzing a memory module operating within an application system Grant 8,356,215 - Lai , et al. January 15, 2	2013-01-15
Determining Data Valid Windows In A System And Method For Testing An Integrated Circuit Device App 20120047411 - Lai; Bosco Chun Sang ; et al.	2012-02-23
Testing Apparatus And Method For Analyzing A Memory Module Operating Within An Application System App 20110179324 - LAI; Bosco Chun Sang ; et al.	2011-07-21
Systems and methods for testing integrated circuit devices Grant 7,848,899 - Lai , et al. December 7, 2	2010-12-07
Systems And Methods For Testing Integrated Circuit Devices App 20090306925 - LAI; Bosco Chun Sang ; et al.	2009-12-10
Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels Grant 7,620,861 - Lai , et al. November 17, 2	2009-11-17
Method And Apparatus For Testing Integrated Circuits By Employing Test Vector Patterns That Satisfy Passband Requirements Imposed By Communication Channels App 20080301509 - Lai; Bosco Chun Sang ; et al.	2008-12-04

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