loadpatents
name:-0.015331983566284
name:-0.015638828277588
name:-0.00056099891662598
Ho; Herbert Lei Patent Filings

Ho; Herbert Lei

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ho; Herbert Lei.The latest application filed is for "methods for deep trench mim capacitor moat isolation with n+ epitaxial semiconductor wafer scheme".

Company Profile
0.14.13
  • Ho; Herbert Lei - New Windsor NY
  • Ho; Herbert Lei - Hopewell Junction NY US
  • Ho, Herbert Lei - Cornwall NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Deep trench MIM capacitor and moat isolation with epitaxial semiconductor wafer scheme
Grant 9,171,848 - Dyer , et al. October 27, 2
2015-10-27
High-K and metal filled trench-type EDRAM capacitor with electrode depth and dimension control
Grant 9,059,194 - Brodsky , et al. June 16, 2
2015-06-16
Methods for Deep Trench MIM Capacitor Moat Isolation with N+ Epitaxial Semiconductor Wafer Scheme
App 20150145102 - Dyer; Thomas Walter ;   et al.
2015-05-28
High-k And Metal Filled Trench-type Edram Capacitor With Electrode Depth And Dimension Control
App 20150102463 - Brodsky; Colin J. ;   et al.
2015-04-16
High-K and Metal Filled Trench-Type EDRAM Capacitor with Electrode Depth and Dimension Control
App 20140191366 - Brodsky; Colin J. ;   et al.
2014-07-10
Capacitor with deep trench ion implantation
Grant 8,642,440 - Pei , et al. February 4, 2
2014-02-04
Capacitor With Deep Trench Ion Implantation
App 20130099354 - Pei; Chengwen ;   et al.
2013-04-25
DRAM with schottky barrier FET and MIM trench capacitor
Grant 8,343,864 - Goyal , et al. January 1, 2
2013-01-01
Dram With Schottky Barrier Fet And Mim Trench Capacitor
App 20120248522 - Goyal; Puneet ;   et al.
2012-10-04
Metal gate integration structure and method including metal fuse, anti-fuse and/or resistor
Grant 8,159,040 - Coolbaugh , et al. April 17, 2
2012-04-17
Trench metal-insulator-metal (MIM) capacitors integrated with middle-of-line metal contacts, and method of fabricating same
Grant 7,682,896 - Ho , et al. March 23, 2
2010-03-23
Metal Gate Integration Structure And Method Including Metal Fuse, Anti-fuse And/or Resistor
App 20090283840 - Coolbaugh; Douglas D. ;   et al.
2009-11-19
Self-aligned, silicided, trench-based DRAM/eDRAM processes with improved retention
Grant 7,564,086 - Kwon , et al. July 21, 2
2009-07-21
Ferromagnetic memory cell and methods of making and using the same
Grant 7,491,994 - Cheng , et al. February 17, 2
2009-02-17
SELF-ALIGNED, SILICIDED, TRENCH-BASED DRAM/eDRAM PROCESSES WITH IMPROVED RETENTION
App 20070235792 - Kwon; Oh-Jung ;   et al.
2007-10-11
Trench Metal-insulator-metal (mim) Capacitors Integrated With Middle-of-line Metal Contacts, And Method Of Fabricating Same
App 20070218625 - Ho; Herbert Lei ;   et al.
2007-09-20
Trench Metal-insulator-metal (mim) Capacitors Integrated With Middle-of-line Metal Contacts, And Method Of Fabricating Same
App 20070057302 - Ho; Herbert Lei ;   et al.
2007-03-15
Ferromagnetic memory cell and methods of making and using the same
App 20070045686 - Cheng; Kangguo ;   et al.
2007-03-01
Self-aligned, silicided, trench-based, DRAM/EDRAM processes with improved retention
Grant 7,153,737 - Kwon , et al. December 26, 2
2006-12-26
Self-aligned, Silicided, Trench-based, Dram/edram Processes With Improved Retention
App 20060160298 - Kwon; Oh-Jung ;   et al.
2006-07-20
Method for patterning a silicon-on-insulator photomask
App 20030028855 - Bard, Karen Ann ;   et al.
2003-02-06
Method of controllably forming a LOCOS oxide layer over a portion of a vertically extending sidewall of a trench extending into a semiconductor substrate
Grant 6,153,474 - Ho , et al. November 28, 2
2000-11-28
Deep trench with enhanced sidewall surface area
Grant 6,015,985 - Ho , et al. January 18, 2
2000-01-18
High dielectric TiO.sub.2 -SiN composite films for memory applications
Grant 6,014,310 - Bronner , et al. January 11, 2
2000-01-11
High dielectric TiO.sub.2 -SiN composite films for memory applications
Grant 5,876,788 - Bronner , et al. March 2, 1
1999-03-02

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed