| Patent | Date |
|---|
Hybrid Shielding Sockets With Impedance Tuning For Integrated Circuit Device Test Tooling
App 20220236302 - Barabi; Nasser ; et al. | 2022-07-28 |
Contactor with angled depressible probes in shifted bores
Grant 11,378,588 - Barabi , et al. July 5, 2 | 2022-07-05 |
Integrated circuit device test tooling with dual angle cavities
Grant 11,293,976 - Barabi , et al. April 5, 2 | 2022-04-05 |
Integrated Circuit Device Test Tooling With Dual Angle Cavities
App 20220099733 - Barabi; Nasser ; et al. | 2022-03-31 |
Contactor With Angled Depressible Probes In Shifted Bores
App 20210102972 - Barabi; Nasser ; et al. | 2021-04-08 |
Systems and methods for conforming device testers to integrated circuit device with pressure relief valve
Grant 10,908,207 - Barabi , et al. February 2, 2 | 2021-02-02 |
Systems And Methods For High Speed Test Probing Of Densely Packaged Semiconductor Devices
App 20200379010 - Tienzo; Joven R. ; et al. | 2020-12-03 |
Contactor With Angled Depressible Probes
App 20200225264 - Barabi; Nasser ; et al. | 2020-07-16 |
Contactor with angled depressible probes
Grant 10,481,175 - Barabi , et al. Nov | 2019-11-19 |
Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plate
Grant 10,126,356 - Barabi , et al. November 13, 2 | 2018-11-13 |
Systems and methods for reliable integrated circuit device test tooling
Grant 10,094,853 - Barabi , et al. October 9, 2 | 2018-10-09 |
Contactor With Angled Depressible Probes
App 20180172730 - Barabi; Nasser ; et al. | 2018-06-21 |
Systems and methods for conforming test tooling to integrated circuit device with heater socket
Grant 9,804,223 - Barabi , et al. October 31, 2 | 2017-10-31 |
Systems and Methods for Conforming Device Testers to Integrated Circuit Device With Pressure Relief Valve
App 20170030964 - Barabi; Nasser ; et al. | 2017-02-02 |
Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structure
Grant 9,557,373 - Barabi , et al. January 31, 2 | 2017-01-31 |
Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanisms
Grant 9,494,642 - Barabi , et al. November 15, 2 | 2016-11-15 |
Systems And Methods For Conforming Test Tooling To Integrated Circuit Device With Whirlwind Cold Plate
App 20160313390 - Barabi; Nasser ; et al. | 2016-10-27 |
Systems and methods for conforming device testers to integrated circuit device with pressure relief valve
Grant 9,383,406 - Barabi , et al. July 5, 2 | 2016-07-05 |
Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushings
Grant 9,279,852 - Barabi , et al. March 8, 2 | 2016-03-08 |
Systems And Methods For Reliable Integrated Circuit Device Test Tooling
App 20160025806 - Barabi; Nasser ; et al. | 2016-01-28 |
Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestals
Grant 9,229,049 - Barabi , et al. January 5, 2 | 2016-01-05 |
Systems And Methods For Conforming Test Tooling To Integrated Circuit Device With Heater Socket
App 20150309114 - Barabi; Nasser ; et al. | 2015-10-29 |
Universal spring contact pin and IC test socket therefor
Grant 9,046,568 - Ho , et al. June 2, 2 | 2015-06-02 |
Systems and Methods for Conforming Device Testers to Integrated Circuit Device With Pressure Relief Valve
App 20150109009 - Barabi; Nasser ; et al. | 2015-04-23 |
Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature control
Grant 9,007,080 - Barabi , et al. April 14, 2 | 2015-04-14 |
Systems And Methods For Conforming Test Tooling To Integrated Circuit Device Profiles With Coaxial Socket
App 20150022226 - Barabi; Nasser ; et al. | 2015-01-22 |
Systems And Methods For Conforming Test Tooling To Integrated Circuit Device Profiles With Convex Support Structure
App 20140232426 - Barabi; Nasser ; et al. | 2014-08-21 |
Systems And Methods For Conforming Test Tooling To Integrated Circuit Device Profiles With Ejection Mechanisms
App 20140055154 - Barabi; Nasser ; et al. | 2014-02-27 |
Systems and methods for thermal control of integrated circuits during testing
Grant 8,653,842 - Barabi , et al. February 18, 2 | 2014-02-18 |
Systems And Methods For Conforming Test Tooling To Integrated Circuit Device Profiles With Sockets Having Secured And Replaceable Bushings
App 20140021972 - Barabi; Nasser ; et al. | 2014-01-23 |
Systems And Methods For Conforming Test Tooling To Integrated Circuit Device Profiles With Compliant Pedestals
App 20140015556 - Barabi; Nasser ; et al. | 2014-01-16 |
Systems and Methods for Conforming Device Testers to Integrated Circuit Device Profiles with Feedback Temperature Control
App 20130271170 - Barabi; Nasser ; et al. | 2013-10-17 |
Thermal control unit used to maintain the temperature of IC devices under test
Grant 8,508,245 - Barabi , et al. August 13, 2 | 2013-08-13 |
Spring contact pin for an ic test socket and the like
Grant 8,493,085 - Barabi , et al. July 23, 2 | 2013-07-23 |
Systems and Methods for Conforming Device Testers to Integrated Circuit Device Profiles
App 20130021049 - Barabi; Nasser ; et al. | 2013-01-24 |
Systems and Methods for Thermal Control of Integrated Circuits During Testing
App 20110214843 - Barabi; Nasser ; et al. | 2011-09-08 |
Universal Spring Contact Pin And Ic Test Socket Therefor
App 20110057676 - Ho; Chee-Wah ; et al. | 2011-03-10 |
Spring Contact Pin For An Ic Test Socket And The Like
App 20100277191 - Barabi; Nasser ; et al. | 2010-11-04 |
Active thermal control unit for maintaining the set point temperature of a DUT
Grant 7,663,388 - Barabi , et al. February 16, 2 | 2010-02-16 |
Chip actuator cover assembly
Grant 7,651,340 - Barabi , et al. January 26, 2 | 2010-01-26 |
Contactor nest for an IC device and method
Grant 7,583,097 - Barabi , et al. September 1, 2 | 2009-09-01 |
Contactor nest for an IC device and method
App 20080265924 - Barabi; Nasser ; et al. | 2008-10-30 |
Active thermal control unit for maintaining the set point temperature of a DUT
App 20080252324 - Barabi; Nasser ; et al. | 2008-10-16 |
Chip actuator cover assembly
App 20080207037 - Barabi; Nasser ; et al. | 2008-08-28 |
Spring contact pin for an IC chip tester
App 20070018666 - Barabi; Nasser ; et al. | 2007-01-25 |
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