Hiwada; Kiyoyasu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hiwada; Kiyoyasu.The latest application filed is for "testing device and testing method for sheet-shaped cell".
- Hiwada; Kiyoyasu - Tokyo JP
- Hiwada; Kiyoyasu - Musashino JP
- HIWADA; Kiyoyasu - Musashino-shi JP
- Hiwada; Kiyoyasu - Yamato JP
| Patent | Date |
|---|---|
| Secondary battery Grant 10,347,893 - Kudoh , et al. July 9, 2 | 2019-07-09 |
| Secondary battery-mounted circuit chip and manufacturing method thereof Grant 10,090,507 - Tsunokuni , et al. October 2, 2 | 2018-10-02 |
| Evaluation apparatus and evaluation method of sheet type cell Grant 10,036,780 - Dewa , et al. July 31, 2 | 2018-07-31 |
| Secondary battery Grant 9,972,862 - Kudoh , et al. May 15, 2 | 2018-05-15 |
| Electrode structure of solid type secondary battery Grant 9,865,908 - Kudoh , et al. January 9, 2 | 2018-01-09 |
| Repair apparatus of sheet type cell Grant 9,799,927 - Hiwada , et al. October 24, 2 | 2017-10-24 |
| Semiconductor probe, testing device and testing method for testing quantum battery Grant 9,778,284 - Dewa , et al. October 3, 2 | 2017-10-03 |
| Single layer secondary battery having a folded structure Grant 9,748,596 - Kudoh , et al. August 29, 2 | 2017-08-29 |
| Charging/discharging device Grant 9,735,594 - Dewa , et al. August 15, 2 | 2017-08-15 |
| Testing Device And Testing Method For Sheet-shaped Cell App 20170131361 - SAITO; Tomokazu ; et al. | 2017-05-11 |
| Battery App 20170098870 - OGASAWARA; Juri ; et al. | 2017-04-06 |
| Secondary Battery-mounted Circuit Chip And Manufacturing Method Thereof App 20160181588 - TSUNOKUNI; Kazuyuki ; et al. | 2016-06-23 |
| Testing device and testing method for quantum battery using semiconductor probe Grant 9,164,149 - Dewa , et al. October 20, 2 | 2015-10-20 |
| Semiconductor Probe, Testing Device And Testing Method For Testing Quantum Battery App 20150192611 - Dewa; Harutada ; et al. | 2015-07-09 |
| Secondary Battery App 20150188113 - Kudoh; Takuo ; et al. | 2015-07-02 |
| Charging/discharging Device App 20150188337 - Dewa; Harutada ; et al. | 2015-07-02 |
| Electrode Structure Of Solid Type Secondary Battery App 20150155608 - Kudoh; Takuo ; et al. | 2015-06-04 |
| Secondary Battery App 20150111108 - Kudoh; Takuo ; et al. | 2015-04-23 |
| Secondary Battery App 20150072231 - Kudoh; Takuo ; et al. | 2015-03-12 |
| Repair Apparatus Of Sheet Type Cell App 20150000119 - Hiwada; Kiyoyasu ; et al. | 2015-01-01 |
| Evaluation Apparatus And Evaluation Method Of Sheet Type Cell App 20140327445 - Dewa; Harutada ; et al. | 2014-11-06 |
| Testing Device And Testing Method For Quantum Battery Using Semiconductor Probe App 20140320108 - Dewa; Harutada ; et al. | 2014-10-30 |
| High speed data train generating system with no restriction on length of generated data train Grant 5,404,564 - Hiwada , et al. April 4, 1 | 1995-04-04 |
| Apparatus and method for testing electronic devices Grant 5,289,116 - Kurita , et al. February 22, 1 | 1994-02-22 |
| Test head with improved shielding Grant 5,051,689 - Hiwada , et al. September 24, 1 | 1991-09-24 |
| Test head with improved shielding Grant 4,975,639 - Hiwada , et al. December 4, 1 | 1990-12-04 |
| Method and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signal Grant 4,833,403 - Tamamura , et al. May 23, 1 | 1989-05-23 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 