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Patent applications and USPTO patent grants for Hitachi High-Technologies.The latest application filed is for "semiconductor inspecting apparatus".
Patent | Date |
---|---|
Measurement or inspecting apparatus Grant 8,921,781 - Miya , et al. December 30, 2 | 2014-12-30 |
Measurement or inspecting apparatus Grant 08921781 - | 2014-12-30 |
Semiconductor Inspecting Apparatus App 20130327939 - MIYA; Go ;   et al. | 2013-12-12 |
Scanning electron microscope and CD measurement calibration standard specimen Grant 8,399,832 - Mizuno , et al. March 19, 2 | 2013-03-19 |
Microsphere-Containing Cell Aggregate App 20120225483 - Tabata; Yasuhiko | 2012-09-06 |
Methods for Sample Preparation and Observation, Charged Particle Apparatus App 20090127458 - ISHITANI; Tohru ;   et al. | 2009-05-21 |
Capillary electrophoresis apparatus and electrophoresis method App 20070163882 - Yamazaki; Motohiro ;   et al. | 2007-07-19 |
Liquid metal ion gun App 20060097186 - Kaga; Hiroyasu ;   et al. | 2006-05-11 |
Plasma processing apparatus Grant 6,664,738 - Arai , et al. December 16, 2 | 2003-12-16 |
Biochemical analysis machine Grant D474,416 - Oonuma , et al. May 13, 2 | 2003-05-13 |
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