Hitachi High-Electronics Corporation
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hitachi High-Electronics Corporation.The latest application filed is for "apparatus and method for inspecting defects".
- Hitachi High-Electronics Corporation - Tokyo JP
| Patent | Date |
|---|---|
| Apparatus and method for inspecting defects Grant 7,187,438 - Hamamatsu , et al. March 6, 2 | 2007-03-06 |
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