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Method and its apparatus for inspecting particles or defects of a semiconductor device
Grant 8,072,597 - Nishiyama , et al. December 6, 2 | 2011-12-06 |
System for monitoring foreign particles, process processing apparatus and method of electronic commerce
Grant 7,499,157 - Nishiyama , et al. March 3, 2 | 2009-03-03 |
Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridge
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Apparatus for automated preparation of DNA samples and reactor for preparing DNA samples
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Polishing apparatus with abrasive tape, polishing method using abrasive tape and manufacturing method for magnetic disk
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Method and apparatus for bonding substrate plates together through gap-forming sealer material
Grant 6,790,300 - Watanabe , et al. September 14, 2 | 2004-09-14 |
Apparatus for detecting foreign particle and defect and the same method
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Apparatus and method for processing a substrate
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Testing apparatus of magnetic recording medium or magnetic head including a plurality of analog-to-digital converters which convert reproduced testing data into digital data
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Inspecting method and apparatus for repeated micro-miniature patterns
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Method and apparatus to generate a ground level of a semiconductor IC tester having a plurality of substrates
Grant 6,642,734 - Tsuyuki , et al. November 4, 2 | 2003-11-04 |
Apparatus and method for processing a substrate
Grant 6,631,726 - Kinoshita , et al. October 14, 2 | 2003-10-14 |
Phase interference detecting method and system in interferometer, and light detector therefor
Grant 6,628,402 - Yamaba , et al. September 30, 2 | 2003-09-30 |
Surface defect tester
Grant 6,617,603 - Ishiguro , et al. September 9, 2 | 2003-09-09 |
Apparatus and method for measuring pattern alignment error
Grant 6,600,561 - Tabei July 29, 2 | 2003-07-29 |
Apparatus and method of inspecting foreign particle or defect on a sample
Grant 6,597,448 - Nishiyama , et al. July 22, 2 | 2003-07-22 |
Method and apparatus for testing IC device
Grant 6,515,470 - Suzuki , et al. February 4, 2 | 2003-02-04 |
Optical system for detecting surface defect and surface defect tester using the same
Grant 6,509,966 - Ishiguro January 21, 2 | 2003-01-21 |
Method and apparatus for treating surface of substrate plate
App 20020192391 - Wada, Kenya ; et al. | 2002-12-19 |
Driver circuit integrated with load current output circuit, pin electronics and IC tester having thereof
App 20020171446 - Takechi, Keizo ; et al. | 2002-11-21 |
Magnetic disk read/write circuit having core coils of opposite phase
Grant 6,473,258 - Shitara , et al. October 29, 2 | 2002-10-29 |
Drying apparatus for a substrate and drying method thereof
Grant 6,418,640 - Fukuda , et al. July 16, 2 | 2002-07-16 |
Testing apparatus and method of IC devices
Grant 6,414,510 - Takeuchi , et al. July 2, 2 | 2002-07-02 |
Optical apparatus for defect and particle size inspection
Grant 6,411,377 - Noguchi , et al. June 25, 2 | 2002-06-25 |
Sample loading sheet
Grant 6,376,231 - Enomoto , et al. April 23, 2 | 2002-04-23 |
Method and apparatus for bonding substrate plates together through gap-forming sealer material
App 20020043344 - Watanabe, Hiroyuki ; et al. | 2002-04-18 |
Raid library apparatus for transportable media and method of controlling the library apparatus
Grant 6,366,982 - Suzuki , et al. April 2, 2 | 2002-04-02 |
Apparatus and method for inspecting surface of semiconductor wafer or the like
App 20020036771 - Sato, Tatsuya ; et al. | 2002-03-28 |
Wafer thickness measuring apparatus and detection method thereof
Grant 6,353,473 - Ishimori , et al. March 5, 2 | 2002-03-05 |
Method and apparatus for testing IC device
App 20020026258 - Suzuki, Tetsuya ; et al. | 2002-02-28 |
Digital calibration method and apparatus for A/D or D/A converters
Grant 6,351,228 - Kutsuno , et al. February 26, 2 | 2002-02-26 |
Method and apparatus for drying substrate plates
App 20010015021 - Gommori, Kazuhiko ; et al. | 2001-08-23 |
Semiconductor device tester and method for testing semiconductor device
Grant 6,275,023 - Oosaki , et al. August 14, 2 | 2001-08-14 |
IC device contactor
Grant 6,204,681 - Nagatsuka , et al. March 20, 2 | 2001-03-20 |
IC testing apparatus and method
Grant 6,138,257 - Wada , et al. October 24, 2 | 2000-10-24 |
Method and apparatus for electrophoresis separation and detection
Grant 6,132,578 - Kambara , et al. October 17, 2 | 2000-10-17 |
Method and apparatus for laser-texturing disk surfaces
Grant 6,004,487 - Wada , et al. December 21, 1 | 1999-12-21 |
System for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss value
Grant 6,002,989 - Shiba , et al. December 14, 1 | 1999-12-14 |
MR head offset correction method and magnetic disk certifier
Grant 5,998,994 - Mori December 7, 1 | 1999-12-07 |
DNA analyzer
Grant 5,976,338 - Fujita , et al. November 2, 1 | 1999-11-02 |
Apparatus and method for inspecting disks
Grant 5,909,117 - Nakadai , et al. June 1, 1 | 1999-06-01 |
Inspection method and device of wafer surface
Grant 5,903,342 - Yatsugake , et al. May 11, 1 | 1999-05-11 |
Surface defect test method and surface defect tester
Grant 5,898,491 - Ishiguro , et al. April 27, 1 | 1999-04-27 |
Disk texturing apparatus
Grant 5,885,143 - Ichikawa , et al. March 23, 1 | 1999-03-23 |
Method and apparatus for processing substrates
Grant 5,879,576 - Wada , et al. March 9, 1 | 1999-03-09 |
Device and method for positioning a notched wafer
Grant 5,851,102 - Okawa , et al. December 22, 1 | 1998-12-22 |
Extraneous substance inspection apparatus for patterned wafer
Grant 5,818,576 - Morishige , et al. October 6, 1 | 1998-10-06 |
Extraneous substance inspection apparatus for patterned wafer
Grant 5,724,132 - Morishige , et al. March 3, 1 | 1998-03-03 |
Gravitational IC package transfer mechanism
Grant 5,702,224 - Kubota December 30, 1 | 1997-12-30 |
Surface inspection method and apparatus
Grant 5,694,214 - Watanabe , et al. December 2, 1 | 1997-12-02 |
Disk used for calibrating floating height of protrusion detection head, method of calibrating floating height of protrusion detection head using the disk and glide tester using the method
Grant 5,675,462 - Ayabe October 7, 1 | 1997-10-07 |
Extraneous substance inspection method and apparatus
Grant 5,644,393 - Nakamura , et al. July 1, 1 | 1997-07-01 |
DNA base sequencer
Grant 5,556,529 - Nemoto September 17, 1 | 1996-09-17 |
DNA base sequencer
Grant 5,552,322 - Nemoto , et al. September 3, 1 | 1996-09-03 |
Magnetic disk tester
Grant 5,423,111 - Mori June 13, 1 | 1995-06-13 |
Apparatus for gel electrophoresis
Grant 5,294,323 - Togusari , et al. March 15, 1 | 1994-03-15 |
Fluorescence detection type electrophoresis apparatus
Grant 5,290,419 - Kambara , et al. March 1, 1 | 1994-03-01 |
Apparatus for detecting extraneous substances on a glass plate
Grant 5,245,403 - Kato , et al. September 14, 1 | 1993-09-14 |
Disk washing apparatus
Grant 5,092,011 - Gommori , et al. March 3, 1 | 1992-03-03 |
Delay circuit including an improved CR integrator circuit
Grant 4,710,654 - Saitoh , et al. December 1, 1 | 1987-12-01 |
Magnetic shield for rotary actuator in a magnetic disc device
Grant 4,658,313 - Takahashi , et al. April 14, 1 | 1987-04-14 |
Automatic contaminants detection apparatus
Grant 4,614,427 - Koizumi , et al. September 30, 1 | 1986-09-30 |
Automatic bacterial colony transfer apparatus
Grant 4,613,573 - Shibayama , et al. September 23, 1 | 1986-09-23 |
IC magazine supply system
Grant 4,588,342 - Hirokawa , et al. May 13, 1 | 1986-05-13 |
Light beam scanning apparatus and the method
Grant 4,464,011 - Takahashi , et al. August 7, 1 | 1984-08-07 |
Track displacement detecting and measuring system
Grant 4,173,073 - Fukazawa , et al. November 6, 1 | 1979-11-06 |
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