loadpatents
name:-0.015090942382812
name:-0.010051965713501
name:-0.00051999092102051
Hiroshima; Masahito Patent Filings

Hiroshima; Masahito

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hiroshima; Masahito.The latest application filed is for "imprint apparatus and imprint method".

Company Profile
0.8.11
  • Hiroshima; Masahito - Tokyo JP
  • HIROSHIMA; Masahito - Chuo-ku JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Imprint apparatus and imprint method
Grant 10,131,135 - Matsuoka , et al. November 20, 2
2018-11-20
Imprint Apparatus And Imprint Method
App 20170021607 - MATSUOKA; Yasuo ;   et al.
2017-01-26
Phase Shift Mask And Method For Manufacturing The Same, And Method For Manufacturing Integrated Circuit
App 20120058421 - HIROSHIMA; Masahito
2012-03-08
Phase shift mask and method for manufacturing the same, and method for manufacturing integrated circuit
Grant 8,124,303 - Hiroshima February 28, 2
2012-02-28
Apparatus including defect correcting system which repeats a correcting of a reticle pattern defect and a correcting method using the apparatus
Grant 8,090,188 - Hiroshima January 3, 2
2012-01-03
Fine resist pattern forming method and nanoimprint mold structure
Grant 7,922,960 - Hiroshima April 12, 2
2011-04-12
Semiconductor device and manufacturing method thereof
Grant 7,776,495 - Hiroshima , et al. August 17, 2
2010-08-17
Phase Shift Mask And Method For Manufacturing The Same, And Method For Manufacturing Integrated Circuit
App 20100159369 - HIROSHIMA; Masahito
2010-06-24
Variable shaped electron beam lithography system and method for manufacturing substrate
Grant 7,714,308 - Hiroshima May 11, 2
2010-05-11
Method of manufacturing phase shift photomask
App 20090092906 - Hiroshima; Masahito
2009-04-09
Fine resist pattern forming method and nanoimprint mold structure
App 20090001634 - Hiroshima; Masahito
2009-01-01
Method of manufacturing semiconductor device
Grant 7,438,998 - Hiroshima October 21, 2
2008-10-21
Variable shaped electron beam lithography system and method for manufacturing substrate
App 20080054196 - Hiroshima; Masahito
2008-03-06
Apparatus for correcting defects in a reticle pattern and correcting method for the same
App 20080050010 - Hiroshima; Masahito
2008-02-28
Semiconductor device and manufacturing method thereof
App 20070172746 - Hiroshima; Masahito ;   et al.
2007-07-26
Semiconductor device and manufacturing method thereof
Grant 7,208,788 - Hiroshima , et al. April 24, 2
2007-04-24
Semiconductor device and manufacturing method thereof
App 20050116272 - Hiroshima, Masahito ;   et al.
2005-06-02
Method of manufacturing semiconductor device
App 20050084806 - Hiroshima, Masahito
2005-04-21
Method of manufacturing semiconductor device
App 20050074679 - Hiroshima, Masahito
2005-04-07

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed