Hirose; Kotoko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hirose; Kotoko.The latest application filed is for "scanning charged particle beam device and method for correcting chromatic spherical combination aberration".

Company Profile

0.13.10

Hirose; Kotoko - Matsudo N/A JP
Hirose; Kotoko - Abiko N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Scanning charged particle beam device and method for correcting chromatic spherical combination aberration Grant 8,772,732 - Nakano , et al. July 8, 2	2014-07-08
Charged particle beam apparatus and geometrical aberration measurement method therefor Grant 8,581,190 - Nakano , et al. November 12, 2	2013-11-12
Charged particle beam apparatus including aberration corrector Grant 8,558,171 - Hirose , et al. October 15, 2	2013-10-15
Method and apparatus of tilted illumination observation Grant 8,436,899 - Kawasaki , et al. May 7, 2	2013-05-07
Charged particle radiation device provided with aberration corrector Grant 8,258,475 - Hirose , et al. September 4, 2	2012-09-04
Scanning Charged Particle Beam Device And Method For Correcting Chromatic Spherical Combination Aberration App 20120199739 - Nakano; Tomonori ; et al.	2012-08-09
Charged Particle Beam Apparatus Including Aberration Corrector App 20120153146 - HIROSE; Kotoko ; et al.	2012-06-21
Charged particle beam apparatus including aberration corrector Grant 8,129,680 - Hirose , et al. March 6, 2	2012-03-06
Charged Particle Radiation Device Provided With Aberration Corrector App 20110272578 - Hirose; Kotoko ; et al.	2011-11-10
Charged Particle Beam Instrument Comprising An Aberration Corrector App 20110210248 - HIROSE; Kotoko ; et al.	2011-09-01
Charged Particle Beam Apparatus And Geometrical Aberration Measurement Method Therefore App 20110139980 - Nakano; Tomonori ; et al.	2011-06-16
Method for estimation of probe shape in charged particle beam instruments Grant 7,915,582 - Hirose , et al. March 29, 2	2011-03-29
Aberration corrector and charged particle beam apparatus using the same Grant 7,834,326 - Kawasaki , et al. November 16, 2	2010-11-16
Method For Estimation Of Probe Shape In Charged Particle Beam Instruments App 20100264309 - HIROSE; Kotoko ; et al.	2010-10-21
Charged particle beam apparatus, aberration correction value calculation unit therefor, and aberration correction program therefor Grant 7,714,286 - Nakano , et al. May 11, 2	2010-05-11
Method and Apparatus of Tilted Illumination Observation App 20100033560 - Kawasaki; Takeshi ; et al.	2010-02-11
Charged Particle Beam Apparatus Including Aberration Corrector App 20090212228 - HIROSE; Kotoko ; et al.	2009-08-27
Aberration Corrector And Charged Particle Beam Apparatus Using The Same App 20090039281 - KAWASAKI; Takeshi ; et al.	2009-02-12
Charged Particle Beam Apparatus, Aberration Correction Value Calculation Unit Therefor, And Aberration Correction Program Therefor App 20090008550 - Nakano; Tomonori ; et al.	2009-01-08

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