loadpatents
name:-0.018767833709717
name:-0.012825965881348
name:-0.0013458728790283
HIROOKA; Motoyuki Patent Filings

HIROOKA; Motoyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for HIROOKA; Motoyuki.The latest application filed is for "insulation layer, battery cell sheet, and battery".

Company Profile
1.18.17
  • HIROOKA; Motoyuki - Tokyo JP
  • Hirooka; Motoyuki - Hitachi JP
  • Hirooka; Motoyuki - Kumagaya N/A JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Insulation Layer, Battery Cell Sheet, And Battery
App 20200411900 - UNEMOTO; Atsushi ;   et al.
2020-12-31
Battery Cell Sheet, Secondary Battery, Method of Manufacturing Battery Cell Sheet, and Method of Manufacturing Secondary Battery
App 20200014062 - KAGA; Yusuke ;   et al.
2020-01-09
Scanning probe microscope and sample observing method using the same
Grant 8,695,110 - Nakata , et al. April 8, 2
2014-04-08
Scanning probe microscope and method of observing sample using the same
Grant 8,635,710 - Nakata , et al. January 21, 2
2014-01-21
Graphene grown substrate and electronic/photonic integrated circuits using same
Grant 8,476,739 - Okai , et al. July 2, 2
2013-07-02
Circuit board including a graphene film having contact region covering a recessed region and a patterned metal film covering the contact region and in direct electrical contact therewith, and device including same
Grant 8,471,237 - Okai , et al. June 25, 2
2013-06-25
Scanning Probe Microscope And Sample Observing Method Using The Same
App 20130145507 - NAKATA; Toshihiko ;   et al.
2013-06-06
Micro contact prober
Grant 8,438,660 - Hirooka , et al. May 7, 2
2013-05-07
Graphene grown substrate and electronic/photonic integrated circuits using same
Grant 8,410,474 - Okai , et al. April 2, 2
2013-04-02
Scanning probe microscope and method of observing sample using the same
Grant 8,407,811 - Nakata , et al. March 26, 2
2013-03-26
Electrically connected graphene-metal electrode device, and electronic device, electronic integrated circuit and electro-optical integrated circuit using same
Grant 8,278,658 - Okai , et al. October 2, 2
2012-10-02
Scanning probe microscope and sample observing method using the same
Grant 8,272,068 - Nakata , et al. September 18, 2
2012-09-18
Scanning Probe Microscope and Method of Observing Sample Using the Same
App 20120204297 - NAKATA; Toshihiko ;   et al.
2012-08-09
Scanning probe microscope and method of observing sample using the same
Grant 8,181,268 - Nakata , et al. May 15, 2
2012-05-15
Microcontact Prober
App 20120090056 - Hirooka; Motoyuki ;   et al.
2012-04-12
Graphene Circuit Board Having Improved Electrical Contact Between Graphene And Metal Electrode, And Device Including Same
App 20110198558 - Okai; Makoto ;   et al.
2011-08-18
Graphene Grown Substrate And Electronic/photonic Integrated Circuits Using Same
App 20110175060 - Okai; Makoto ;   et al.
2011-07-21
Transparent conductive film and electronic device including same
Grant 7,976,950 - Okai , et al. July 12, 2
2011-07-12
Scanning Probe Microscope and Method of Observing Sample Using the Same
App 20100325761 - Nakata; Toshihiko ;   et al.
2010-12-23
Transparent Conductive Film And Electronic Device Including Same
App 20100304131 - OKAI; Makoto ;   et al.
2010-12-02
Electrically Connected Graphene-metal Electrode Device, And Electronic Device, Electronic Integrated Circuit And Electro-optical Integrated Circuit Using Same
App 20100270512 - Okai; Makoto ;   et al.
2010-10-28
Scanning Probe Microscope And Method Of Observing Sample Using The Same
App 20100218287 - NAKATA; Toshihiko ;   et al.
2010-08-26
Graphene Grown Substrate And Electronic/photonic Integrated Circuits Using Same
App 20100200839 - Okai; Makoto ;   et al.
2010-08-12
Scanning Probe Microscope And Sample Observing Method Using The Same
App 20100064396 - Nakata; Toshihiko ;   et al.
2010-03-11
Probe For Scanning Probe Microscope
App 20100043108 - Hirooka; Motoyuki ;   et al.
2010-02-18
Measuring Apparatus Having Nanotube Probe
App 20090243637 - OKAI; Makoto ;   et al.
2009-10-01
Cantilever and inspecting apparatus
App 20070051887 - Hidaka; Kishio ;   et al.
2007-03-08

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