Hiroo; Yasumasa

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hiroo; Yasumasa.The latest application filed is for "polishing method, polishing monitoring method and polishing monitoring apparatus for workpiece".

Company Profile

4.12.14

Hiroo; Yasumasa - Tokyo JP
Hiroo; Yasumasa - Kanagawa JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Polishing Method, Polishing Monitoring Method And Polishing Monitoring Apparatus For Workpiece App 20220176513 - Watanabe; Yuki ; et al.	2022-06-09
Substrate Processing Apparatus And Method For Controlling Dressing Of Polishing Member App 20220048160 - Hiroo; Yasumasa ; et al.	2022-02-17
Substrate polishing apparatus and method Grant 10,828,747 - Hiroo , et al. November 10, 2	2020-11-10
Polishing Apparatus And Polishing Member Dressing Method App 20200198094 - Yagi; Keita ; et al.	2020-06-25
Substrate Polishing Apparatus And Method App 20190009385 - HIROO; Yasumasa ; et al.	2019-01-10
Polishing apparatus and polishing method Grant 9,440,327 - Hiroo , et al. September 13, 2	2016-09-13
Method of correcting film thickness measurement value, film thickness corrector and eddy current sensor Grant 9,437,507 - Nakamura , et al. September 6, 2	2016-09-06
Method Of Correcting Film Thickness Measurement Value, Film Thickness Corrector And Eddy Current Sensor App 20150262893 - NAKAMURA; Akira ; et al.	2015-09-17
Polishing Apparatus And Polishing Method App 20130344773 - Hiroo; Yasumasa ; et al.	2013-12-26
Polishing method, polishing apparatus and method of monitoring a substrate Grant 8,398,456 - Kobayashi , et al. March 19, 2	2013-03-19
Polishing apparatus and polishing method Grant 8,246,417 - Kobayashi , et al. August 21, 2	2012-08-21
Polishing apparatus and polishing method Grant 8,112,169 - Kobayashi , et al. February 7, 2	2012-02-07
Polishing monitoring method and polishing apparatus Grant 8,078,419 - Kobayashi , et al. December 13, 2	2011-12-13
Polishing Apparatus And Polishing Method App 20100330878 - KOBAYASHI; Yoichi ; et al.	2010-12-30
Polishing Method, Polishing Apparatus And Method Of Monitoring A Substrate App 20100273396 - KOBAYASHI; Yoichi ; et al.	2010-10-28
Polishing apparatus and polishing method Grant 7,822,500 - Kobayashi , et al. October 26, 2	2010-10-26
Polishing apparatus and polishing method App 20100029177 - Kobayashi; Yoichi ; et al.	2010-02-04
Polishing monitoring method and polishing apparatus App 20090104847 - Kobayashi; Yoichi ; et al.	2009-04-23
Substrate transfer controlling apparatus and substrate transferring method Grant 7,313,452 - Kobayashi , et al. December 25, 2	2007-12-25
Polishing Apparatus And Polishing Method App 20070243795 - Kobayashi; Yoichi ; et al.	2007-10-18
Substrate transfer controlling apparatus and substrate transferring method App 20060161286 - Kobayashi; Yoichi ; et al.	2006-07-20
Substrate transfer controlling apparatus and substrate transferring method Grant 7,072,730 - Kobayashi , et al. July 4, 2	2006-07-04
Substrate transfer controlling apparatus and substrate transferring method App 20040249494 - Kobayashi, Yoichi ; et al.	2004-12-09
Wafer transfer control apparatus and method for transferring wafer Grant 6,772,029 - Kobayashi , et al. August 3, 2	2004-08-03
Wafer transfer control apparatus and method for transferring wafer App 20020192055 - Kobayachi, Yoichi ; et al.	2002-12-19

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.